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This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces. Provides readers with a combination of a comprehensive set of formal techniques covering and enhancing different aspects of the state-of-the-art design and test flow for ICs; Introduces newly developed heuristic, formal optimization-based and partition-based retargeting techniques and integrates them into a common framework; Describes fully compliant (with respect to industrial de-facto standard) measures to enhance the DFT, DFD and DFR capabilities while supporting standardized data exchange formats; Includes new measures to tackle shortcomings of existing state-of-the-art methods, including zero-defect enforcing safety-critical applications.

Integrated circuits --- Debugging in computer science. --- Design and construction. --- Testing. --- Computer programs --- Troubleshooting in computer science --- Data editing --- Electronic data processing --- Software failures --- Debugging --- Testing --- Reliability.

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This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces. Provides readers with a combination of a comprehensive set of formal techniques covering and enhancing different aspects of the state-of-the-art design and test flow for ICs; Introduces newly developed heuristic, formal optimization-based and partition-based retargeting techniques and integrates them into a common framework; Describes fully compliant (with respect to industrial de-facto standard) measures to enhance the DFT, DFD and DFR capabilities while supporting standardized data exchange formats; Includes new measures to tackle shortcomings of existing state-of-the-art methods, including zero-defect enforcing safety-critical applications.

Electronics --- Electrical engineering --- Computer architecture. Operating systems --- microprocessoren --- embedded systems --- architectuur (informatica) --- elektrische circuits

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This book highlights historical explanations to and roots of present phenomena of violence, insecurity, and law enforcement in Central America. Violence and crime are among the most discussed topics in Central America today, and sensationalism and fear of crime is as present as the increase of private security, the re-militarization of law enforcement, political populism, and mano dura policies. The contributors to this volume discuss historical forms, paths, continuities, and changes of violence and its public and political discussion in the region. This book thus offers in-depth analysis of different patterns of violence, their reproduction over time, their articulation in the present, and finally their discursive mobilization.

Violence --- History. --- Latin America-Politics and gover. --- Crime—Sociological aspects. --- Terrorism. --- World politics. --- Comparative politics. --- Latin American Politics. --- Crime and Society. --- Terrorism and Political Violence. --- Political History. --- Comparative Politics. --- Acts of terrorism --- Attacks, Terrorist --- Global terrorism --- International terrorism --- Political terrorism --- Terror attacks --- Terrorist acts --- Terrorist attacks --- World terrorism --- Direct action --- Insurgency --- Political crimes and offenses --- Subversive activities --- Political violence --- Terror --- Comparative political systems --- Comparative politics --- Government, Comparative --- Political systems, Comparative --- Political science --- Colonialism --- Global politics --- International politics --- Political history --- World history --- Eastern question --- Geopolitics --- International organization --- International relations --- Latin America—Politics and government. --- Political violence. --- Terrorism --- Central America --- Central America. --- Politics and government. --- Mercado Común Centroamericano countries --- Comparative government.

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Electronics --- Electrical engineering --- Computer architecture. Operating systems --- microprocessoren --- embedded systems --- architectuur (informatica) --- elektrische circuits