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2019 (3)

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Book
Device Physics, Modeling, Technology, and Analysis for Silicon MESFET
Authors: --- ---
ISBN: 3030045137 3030045129 Year: 2019 Publisher: Cham : Springer International Publishing : Imprint: Springer,

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Abstract

This book provides detailed and accurate information on the history, structure, operation, benefits and advanced structures of silicon MESFET, along with modeling and analysis of the device. The authors explain the detailed physics that are important in modeling of SOI-MESFETs, and present the derivations of compact model expressions so that users can recognize the physical meaning of the model equations and parameters. The discussion also includes advanced structures for SOI-MESFET for submicron applications. Describes the evolution of MESFET in the semiconductor industry; Discusses challenges and solutions associated with downscaling; Provides comprehensive information on the structure and operation of silicon MESFETs.


Digital
Device Physics, Modeling, Technology, and Analysis for Silicon MESFET
Authors: --- ---
ISBN: 9783030045135 Year: 2019 Publisher: Cham Springer International Publishing

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Abstract

This book provides detailed and accurate information on the history, structure, operation, benefits and advanced structures of silicon MESFET, along with modeling and analysis of the device. The authors explain the detailed physics that are important in modeling of SOI-MESFETs, and present the derivations of compact model expressions so that users can recognize the physical meaning of the model equations and parameters. The discussion also includes advanced structures for SOI-MESFET for submicron applications. Describes the evolution of MESFET in the semiconductor industry; Discusses challenges and solutions associated with downscaling; Provides comprehensive information on the structure and operation of silicon MESFETs.


Book
Device Physics, Modeling, Technology, and Analysis for Silicon MESFET
Authors: --- --- ---
ISBN: 9783030045135 Year: 2019 Publisher: Cham Springer International Publishing :Imprint: Springer

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Bookmark

Abstract

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