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Phänomen und Beschreibung : zu Edmund Husserls Logischen Untersuchungen
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Author: Hofmann, Patrick
Year: 2004 Publisher: Fink
Year: 2004 Publisher: Fink
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Phänomen und Beschreibung : zu Edmund Husserls Logischen Untersuchungen
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Author: Hofmann, Patrick
ISBN: 3770540441 Year: 2004 Publisher: München Fink
ISBN: 3770540441 Year: 2004 Publisher: München Fink
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Symbols representing biometrics in use
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Authors:
Choong, Yee-Yin.
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Hofmann, Patrick
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Stanton, Brian.
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Theofanos, Mary.
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National Institute of Standards and Technology (U.S.)
Year: 2009 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
Year: 2009 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
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Quick capture platform graphics
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Authors:
Stanton, Brian.
---
Choong, Yee-Yin.
---
Hofmann, Patrick.
---
Theofanos, Mary.
---
National Institute of Standards and Technology (U.S.)
Year: 2009 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
Year: 2009 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
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