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Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends
Authors: Benninghoven, Alfred --- Rüdenauer, F. G. --- Werner, H. W. --- Herzog, Richard F.
ISBN: 0471010561 Year: 1987 Volume: vol 86 Publisher: New York : J. Wiley,

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Abstract

Keywords
Spectrometric and optical chemical analysis --- fysicochemie --- Secondary ion mass spectrometry. --- Secondary ion mass spectrometry --- SIMS (Spectrum analysis) --- Mass spectrometry --- Congresses --- Spectrométrie de masse. --- Massaspectrometire.

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