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Computerarchitectuur.

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Digital integrated circuits --- Logic design --- Microcomputers --- Microprocessors --- Programming

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Computer-aided design --- Metal oxide semiconductors, Complementary --- Conception assistée par ordinateur --- MOS complémentaires --- Design and construction --- Data processing --- Conception et construction --- Informatique

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Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits.  To improve future semiconductor designs, this book describes methods for analyzing, designing, and testing circuits subject to probabilistic effects. The authors first develop techniques to model inherently probabilistic methods in logic circuits and to test circuits for determining their reliability after they are manufactured. Then, they study error-masking mechanisms intrinsic to digital circuits and show how to leverage them to design more reliable circuits.  The book describes techniques for:   • Modeling and reasoning about probabilistic behavior in logic circuits, including a matrix-based reliability-analysis framework;   • Accurate analysis of soft-error rate (SER) based on functional-simulation, sufficiently scalable for use in gate-level optimizations;   • Logic synthesis for greater resilience against soft errors, which improves reliability using moderate overhead in area and performance;   • Test-generation and test-compaction methods aimed at probabilistic faults in logic circuits that facilitate accurate and efficient post-manufacture measurement of soft-error susceptibility.

Engineering. --- Logic circuits -- Design. --- Logic circuits -- Testing. --- Uncertainty (Information theory). --- Logic circuits --- Uncertainty (Information theory) --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Electrical Engineering --- Design --- Testing --- Logic circuits. --- Measure of uncertainty (Information theory) --- Shannon's measure of uncertainty --- System uncertainty --- Circuits, Logic --- Systems engineering. --- Computer science. --- Computer hardware. --- Operating systems (Computers). --- Logic design. --- Algebra --- Circuits and Systems. --- Arithmetic and Logic Structures. --- Computer Hardware. --- Performance and Reliability. --- Logic Design. --- Symbolic and Algebraic Manipulation. --- Data processing. --- Design, Logic --- Design of logic systems --- Digital electronics --- Electronic circuit design --- Machine theory --- Switching theory --- Computer operating systems --- Computers --- Disk operating systems --- Systems software --- Informatics --- Science --- Engineering systems --- System engineering --- Engineering --- Industrial engineering --- System analysis --- Operating systems --- Design and construction --- Information measurement --- Probabilities --- Questions and answers --- Electronic circuits --- Interface circuits --- Switching circuits --- Circuits --- Electronic circuits. --- Arithmetic and logic units, Computer. --- Computer software—Reusability. --- Computer science—Mathematics. --- Arithmetic and logic units, Computer --- Computer arithmetic --- Electronic digital computers --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics

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Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits.  To improve future semiconductor designs, this book describes methods for analyzing, designing, and testing circuits subject to probabilistic effects. The authors first develop techniques to model inherently probabilistic methods in logic circuits and to test circuits for determining their reliability after they are manufactured. Then, they study error-masking mechanisms intrinsic to digital circuits and show how to leverage them to design more reliable circuits.  The book describes techniques for:   • Modeling and reasoning about probabilistic behavior in logic circuits, including a matrix-based reliability-analysis framework;   • Accurate analysis of soft-error rate (SER) based on functional-simulation, sufficiently scalable for use in gate-level optimizations;   • Logic synthesis for greater resilience against soft errors, which improves reliability using moderate overhead in area and performance;   • Test-generation and test-compaction methods aimed at probabilistic faults in logic circuits that facilitate accurate and efficient post-manufacture measurement of soft-error susceptibility.

Mathematical logic --- Logic --- Algebra --- Mathematics --- Electrical engineering --- Applied physical engineering --- Production management --- Computer science --- Computer architecture. Operating systems --- algebra --- betrouwbaarheid --- computers --- informatica --- ontwerpen --- hardware --- OS (operating system) --- ingenieurswetenschappen --- logica --- computerkunde --- elektrische circuits