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Microelectronic interconnections and assembly
Authors: ---
ISBN: 0792351398 9780792351399 9401061599 9401151350 Year: 1998 Volume: 54 Publisher: Dordrecht : Kluwer,

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MICROELECTRONIC INTERCONNECTIONS AND MICROASSEMBL Y WORKSHOP 18-21 May 1996, Prague, Czech Republic Conference Organizers: George Harman, NIST (USA) and Pavel Mach (Czech Republic) Summary of the Technical Program Thirty two presentations were given in eight technical sessions at the Workshop. A list of these sessions and their chairpersons is attached below. The Workshop was devoted to the technical aspects of advanced interconnections and microassembly, but also included papers on the education issues required to prepare students to work in these areas. In addition to new technical developments, several papers presented overviews predicting the future directions of these technologies. The basic issue is that electronic systems will continue to be miniaturized and at the same time performance must continue to improve. Various industry roadmaps were discussed as well as new smaller packaging and interconnection concepts. The newest chip packages are often based on the selection of an appropriate interconnection method. An example is the chip-scale package, which has horizontal (x-y) dimensions,;; 20% larger than the actual silicon chip itself. The chip is often flip-chip connected to a micro ball-grid-array, but direct chip attach was described also. Several papers described advances in the manufacture of such packages.

Wire bonding in microelectronics : materials, processes, reliability, and yield
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ISBN: 0070326193 Year: 1997 Publisher: New York : McGraw-Hill,


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Semiconductor measurement technology : nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques
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Year: 1979 Publisher: Washington (D.C.): Department of commerce. National bureau of standards

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Microelectronic ultrasonic bonding
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Year: 1974 Publisher: Washington (D.C.): Department of commerce. National bureau of standards

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Semiconductor measurement technology : the use of acoustic emission to determine the integrity of large kovar glass-sealed microelectronic packages
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Year: 1982 Publisher: Washington (D.C.): Department of commerce. National bureau of standards

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Microelectronic ultrasonic bonding
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Year: 1974 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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The use of acoustic emission to determine the integrity of large hybrid packages
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Year: 1980 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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The use of acoustic emission to determine the integrity of large kovar glass-sealed microelectronic packages
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Year: 1982 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Reliability and yield problems of wire bonding in microelectronics : the application of materials and interface science
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ISBN: 0930815254 Year: 1989 Publisher: Reston, Va. : International Society for Hybrid Microelectronics,

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Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satelites
Authors: --- --- --- --- --- et al.
Year: 1994 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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