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Face recognition vendor test 2002 : supplemental report
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Authors:
Grother, Partick.
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National Institute of Standards and Technology (U.S.)
Year: 2004 Publisher: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology,
Year: 2004 Publisher: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology,
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