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Deformable models in medical image analysis
Authors: --- ---
ISBN: 0818685212 Year: 1998 Publisher: Los Alamitos, Calif. : IEEE Computer Society,


Book
Advances in Depth Images Analysis and Applications : International Workshop, WDIA 2012, Tsukuba, Japan, November 11, 2012, Revised Selected and Invited Papers
Authors: --- --- ---
ISBN: 3642403026 3642403034 Year: 2013 Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer,

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Abstract

This book constitutes the refereed proceedings of the  International Workshop on Depth Image Analysis, held in conjunction with ICPR 2012 in Japan in November 2012. The 16 revised full papers presented at the workshop were carefully reviewed and selected from 27 submissions and are complemented with 3 invited papers that were also peer-reviewed. The papers are organized in topical sections on acquisition and modeling of depth data, processing and analysis of depth data, applications, and ICPR contest.

Keywords

Engineering & Applied Sciences --- Electrical & Computer Engineering --- Electrical Engineering --- Computer Science --- Computer science. --- Artificial intelligence. --- Computer graphics. --- Image processing. --- Pattern recognition. --- Computer Science. --- Pattern Recognition. --- Computer Imaging, Vision, Pattern Recognition and Graphics. --- Artificial Intelligence (incl. Robotics). --- Image Processing and Computer Vision. --- Computer Science, general. --- Image analysis --- Optical pattern recognition. --- Computer vision. --- Artificial Intelligence. --- AI (Artificial intelligence) --- Artificial thinking --- Electronic brains --- Intellectronics --- Intelligence, Artificial --- Intelligent machines --- Machine intelligence --- Thinking, Artificial --- Bionics --- Cognitive science --- Digital computer simulation --- Electronic data processing --- Logic machines --- Machine theory --- Self-organizing systems --- Simulation methods --- Fifth generation computers --- Neural computers --- Machine vision --- Vision, Computer --- Artificial intelligence --- Image processing --- Pattern recognition systems --- Optical data processing --- Pattern perception --- Perceptrons --- Visual discrimination --- Informatics --- Science --- Optical data processing. --- Optical computing --- Visual data processing --- Integrated optics --- Photonics --- Computers --- Design perception --- Pattern recognition --- Form perception --- Perception --- Figure-ground perception --- Optical equipment


Digital
Advances in Depth Image Analysis and Applications : International Workshop, WDIA 2012, Tsukuba, Japan, November 11, 2012, Revised Selected and Invited Papers
Authors: --- --- ---
ISBN: 9783642403033 Year: 2013 Publisher: Berlin, Heidelberg Springer

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Abstract

This book constitutes the refereed proceedings of the  International Workshop on Depth Image Analysis, held in conjunction with ICPR 2012 in Japan in November 2012. The 16 revised full papers presented at the workshop were carefully reviewed and selected from 27 submissions and are complemented with 3 invited papers that were also peer-reviewed. The papers are organized in topical sections on acquisition and modeling of depth data, processing and analysis of depth data, applications, and ICPR contest.

Advances in image processing and understanding : a festschrift for Thomas S. Huang
Authors: --- --- ---
ISBN: 9812776958 9789812776952 9789812380913 9812380914 Year: 2002 Publisher: Singapore ; River Edge, N.J. : World Scientific,

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Abstract

This volume of original papers has been assembled to honor the achievements of Professor Thomas S Huang in the area of image processing and image analysis. Professor Huang's life of inquiry has spanned a number of decades as his work on imaging problems began in 1960's. Over these 40 years, he has made many fundamental and pioneering contributions to nearly every area of this field. Professor Huang has received numerous Awards, including the prestigious Jack Kilby Signal Processing Medal from IEEE. He has been elected to the National Academy of Engineering, and named Fellow of IEEE, Fellow of

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