Listing 1 - 10 of 134 | << page >> |
Sort by
|
Choose an application
Regional documentation --- Dutch literature --- Claes, Ernest --- Brabant --- Histoire locale --- Plaatselijke geschiedenis --- 378.18:929 --- C6 --- Studenten: statuut. Maatschappelijke problemen van studenten-:-Biografie. Genealogie. Heraldiek --- Opvoeding, onderwijs, wetenschap --- 378.18:929 Studenten: statuut. Maatschappelijke problemen van studenten-:-Biografie. Genealogie. Heraldiek --- 986.2 --- Hageland--literaire reisgidsen --- Vlaams-Brabant --- Claes, Ernest, --- Claes, Andreas Ernestus Josephus --- Van Hasselt, G.
Choose an application
Regional documentation --- toerisme --- Turnhout
Choose an application
Choose an application
Choose an application
Choose an application
Choose an application
Choose an application
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs. · Enables readers to understand long-term reliability of an integrated circuit; · Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes; · Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology; · Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit.
Electronics -- Materials -- Testing -- Congresses. --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Electrical Engineering --- Linear integrated circuits --- Metal oxide semiconductors, Complementary. --- Reliability. --- CMOS (Electronics) --- Complementary metal oxide semiconductors --- Semiconductors, Complementary metal oxide --- Linear ICs --- Engineering. --- Nanotechnology. --- Electronics. --- Microelectronics. --- Electronic circuits. --- Circuits and Systems. --- Electronics and Microelectronics, Instrumentation. --- Nanotechnology and Microengineering. --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics --- Microminiature electronic equipment --- Microminiaturization (Electronics) --- Microtechnology --- Semiconductors --- Miniature electronic equipment --- Electrical engineering --- Physical sciences --- Molecular technology --- Nanoscale technology --- High technology --- Construction --- Industrial arts --- Technology --- Digital electronics --- Logic circuits --- Transistor-transistor logic circuits --- Analog integrated circuits --- Systems engineering. --- Engineering systems --- System engineering --- Engineering --- Industrial engineering --- System analysis --- Design and construction
Choose an application
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs. · Enables readers to understand long-term reliability of an integrated circuit; · Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes; · Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology; · Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit.
Chemical structure --- Electronics --- Electrical engineering --- Applied physical engineering --- Biotechnology --- nanotechniek --- biotechnologie --- elektronica --- ingenieurswetenschappen --- elektrische circuits
Choose an application
Listing 1 - 10 of 134 | << page >> |
Sort by
|