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Dagje uit: Turnhout : de juiste kaart
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Year: 1990

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Film
Ingenieur elektrotechniek is samen nieuwe dingen maken : [versie voor humaniora]
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Year: 2001 Publisher: Leuven KU Leuven. Audiovisuele dienst [prod., real., dist.]

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Book
Interculturele hulpverlening
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Year: 2003 Publisher: Mechelen Kluwer

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Design tools for analog and mixed-signal integrated circuits : course handouts academic year 2000-2001.
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Year: 2001 Publisher: Leuven K.U.Leuven. Departement elektrotechniek. ESAT-MICAS

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Film
Ingenieur elektrotechniek is samen nieuwe dingen maken : [versie voor kandidaturen]
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Year: 2001 Publisher: Leuven KU Leuven. Audiovisuele dienst [prod., real., dist.]

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Proceedings of the 4th international workshop on symbolic methods and applications in circuit design. SMACD '96.
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Year: 1996 Publisher: Leuven s.n.

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Book
Analog IC reliability in nanometer CMOS
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ISBN: 1489986308 1461461626 1461461634 1299197396 Year: 2013 Publisher: New York, NY : Springer Science,

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This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.   The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.   ·         Enables readers to understand long-term reliability of an integrated circuit; ·         Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes; ·         Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology; ·         Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit.


Digital
Analog IC Reliability in Nanometer CMOS
Authors: ---
ISBN: 9781461461630 Year: 2013 Publisher: New York, NY Springer

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This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.   The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.   ·         Enables readers to understand long-term reliability of an integrated circuit; ·         Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes; ·         Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology; ·         Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit.


Book
Biotechnology
Authors: ---
Year: 1992 Publisher: Leuven KUL. Research and development

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