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Digital
Analysis and Design of Resilient VLSI Circuits : Mitigating Soft Errors and Process Variations
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ISBN: 9781441909312 9781441909329 9781441909305 9781489985101 Year: 2010 Publisher: New York, NY Springer US

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This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors. This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems. Describes the state of the art in the areas of radiation tolerant circuit design and process variation tolerant circuit design; Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems; Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers.


Book
Analysis and design of resilient VLSI circuits : mitigating soft errors and process variations
Authors: ---
ISBN: 1441909303 144190932X 1282836811 1441909311 9786612836817 1489985107 Year: 2010 Publisher: New York ; London : Springer,

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Abstract

This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors. This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems. Describes the state of the art in the areas of radiation tolerant circuit design and process variation tolerant circuit design; Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems; Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers.


Digital
Minimizing and Exploiting Leakage in VLSI Design
Authors: --- ---
ISBN: 9781441909503 9781441909510 9781441909497 9781489985293 Year: 2010 Publisher: New York, NY Springer US

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Minimizing and Exploiting Leakage in VLSI Design Nikhil Jayakumar, Suganth Paul, Rajesh Garg, Kanupriya Gulati and Sunil P. Khatri Power consumption of VLSI (Very Large Scale Integrated) circuits has been growing at an alarmingly rapid rate. This increase in power consumption, coupled with the increasing demand for portable/hand-held electronics, has made power consumption a dominant concern in the design of VLSI circuits today. Traditionally, dynamic (switching) power has dominated the total power consumption of an IC. However, due to current scaling trends, leakage power has now become a major component of the total power consumption in VLSI circuits. Leakage power reduction is especially important in portable/hand-held electronics such as cell-phones and PDAs. This book presents techniques aimed at reducing and exploiting leakage power in digital VLSI ICs. The first part of this book presents several approaches to reduce leakage in a circuit. The second part of this book shows readers how to turn the leakage problem into an opportunity, through the use of sub-threshold logic, with adaptive body bias to make the designs robust to variations. The third part of this book presents design and implementation details of a sub-threshold IC, using the ideas presented in the second part of this book. Provides a variety of approaches to control and exploit leakage, including implicit approaches to find the leakage of all input vectors in a design, techniques to find the minimum leakage vector of a design (with and without circuit modification), ASIC approaches to drastically reduce leakage, and methods to find the optimal reverse bias voltage to maximally reduce leakage. Presents a variation-tolerant, practical design methodology to implement sub-threshold logic using closed-loop adaptive body bias (ABB) and Network of PLA (NPLA) based design. In addition, asynchronous micropipelining techniques are presented, to substantially reclaim the speed penalty of sub-threshold design. Validates the proposed ABB and NPLA sub-threshold design approach by implementing a BFSK transmitter design in the proposed design style. Test results from the fabricated IC are provided as well, indicating that a power improvement of 20X can be obtained for a 0.25um process (projected power improvements are 100X to 500X for 65nm processes).


Book
Analysis and Design of Resilient VLSI Circuits : Mitigating Soft Errors and Process Variations
Authors: --- ---
ISBN: 9781441909312 9781441909329 9781441909305 9781489985101 Year: 2010 Publisher: Boston MA Springer US

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Abstract

This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors. This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems. Describes the state of the art in the areas of radiation tolerant circuit design and process variation tolerant circuit design; Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems; Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers.


Book
Handbook of Inpatient Endocrinology
Authors: --- --- ---
ISBN: 3030389766 3030389758 Year: 2020 Publisher: Cham : Springer International Publishing : Imprint: Springer,

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Abstract

A user-friendly, pocket-sized reference for all physicians faced with endocrine care and challenges in hospitalized patients, this handbook covers the most common issues leading to an inpatient endocrine consult, providing differential diagnoses, a reasonable and practical approach to investigating and managing the condition, and advice for follow-up. Conditions discussed include thyrotoxicosis and thyroid storm, calcium disorders, osteoporosis, Cushing's syndrome, pheochromocytoma and paraganglioma, primary hyperaldosteronism, hypoglycemia in diabetic and non-diabetic patients, and endocrine issues during pregnancy, among others. Suggestions for further reading are included, providing more context for well-established clinical approaches. Written by experts with years of experience providing endocrinology consultations in a hospital setting, Handbook of Inpatient Endocrinology is a valuable, high-yield resource for endocrine residents and fellows, but it will be equally useful for any busy hospitalist or primary care physician when endocrinology consults are not available.


Book
Minimizing and Exploiting Leakage in VLSI Design
Authors: --- --- --- --- --- et al.
ISBN: 9781441909503 9781441909510 9781441909497 9781489985293 Year: 2010 Publisher: Boston MA Springer US

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Abstract

Minimizing and Exploiting Leakage in VLSI Design Nikhil Jayakumar, Suganth Paul, Rajesh Garg, Kanupriya Gulati and Sunil P. Khatri Power consumption of VLSI (Very Large Scale Integrated) circuits has been growing at an alarmingly rapid rate. This increase in power consumption, coupled with the increasing demand for portable/hand-held electronics, has made power consumption a dominant concern in the design of VLSI circuits today. Traditionally, dynamic (switching) power has dominated the total power consumption of an IC. However, due to current scaling trends, leakage power has now become a major component of the total power consumption in VLSI circuits. Leakage power reduction is especially important in portable/hand-held electronics such as cell-phones and PDAs. This book presents techniques aimed at reducing and exploiting leakage power in digital VLSI ICs. The first part of this book presents several approaches to reduce leakage in a circuit. The second part of this book shows readers how to turn the leakage problem into an opportunity, through the use of sub-threshold logic, with adaptive body bias to make the designs robust to variations. The third part of this book presents design and implementation details of a sub-threshold IC, using the ideas presented in the second part of this book. Provides a variety of approaches to control and exploit leakage, including implicit approaches to find the leakage of all input vectors in a design, techniques to find the minimum leakage vector of a design (with and without circuit modification), ASIC approaches to drastically reduce leakage, and methods to find the optimal reverse bias voltage to maximally reduce leakage. Presents a variation-tolerant, practical design methodology to implement sub-threshold logic using closed-loop adaptive body bias (ABB) and Network of PLA (NPLA) based design. In addition, asynchronous micropipelining techniques are presented, to substantially reclaim the speed penalty of sub-threshold design. Validates the proposed ABB and NPLA sub-threshold design approach by implementing a BFSK transmitter design in the proposed design style. Test results from the fabricated IC are provided as well, indicating that a power improvement of 20X can be obtained for a 0.25um process (projected power improvements are 100X to 500X for 65nm processes).


Multi
Handbook of Inpatient Endocrinology
Authors: --- --- --- ---
ISBN: 9783030389765 Year: 2020 Publisher: Cham Springer International Publishing :Imprint: Springer

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Abstract

A user-friendly, pocket-sized reference for all physicians faced with endocrine care and challenges in hospitalized patients, this handbook covers the most common issues leading to an inpatient endocrine consult, providing differential diagnoses, a reasonable and practical approach to investigating and managing the condition, and advice for follow-up. Conditions discussed include thyrotoxicosis and thyroid storm, calcium disorders, osteoporosis, Cushing's syndrome, pheochromocytoma and paraganglioma, primary hyperaldosteronism, hypoglycemia in diabetic and non-diabetic patients, and endocrine issues during pregnancy, among others. Suggestions for further reading are included, providing more context for well-established clinical approaches. Written by experts with years of experience providing endocrinology consultations in a hospital setting, Handbook of Inpatient Endocrinology is a valuable, high-yield resource for endocrine residents and fellows, but it will be equally useful for any busy hospitalist or primary care physician when endocrinology consults are not available.

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