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This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors. This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems. Describes the state of the art in the areas of radiation tolerant circuit design and process variation tolerant circuit design; Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems; Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers.
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This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors. This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems. Describes the state of the art in the areas of radiation tolerant circuit design and process variation tolerant circuit design; Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems; Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers.
Integrated circuits -- Very large scale integration. --- Integrated circuits. --- Very large scale integration. --- Integrated circuits --- Electrical Engineering --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Very large scale integration --- Fault-tolerant computing. --- Computing, Fault-tolerant --- Very large scale integration of circuits --- VLSI circuits --- Engineering. --- Computer-aided engineering. --- Electronic circuits. --- Circuits and Systems. --- Computer-Aided Engineering (CAD, CAE) and Design. --- Electronic data processing --- Electronic digital computers --- Fault tolerance (Engineering) --- Computer system failures --- Reliability --- Systems engineering. --- Computer aided design. --- Engineering systems --- System engineering --- Engineering --- Industrial engineering --- System analysis --- CAD (Computer-aided design) --- Computer-assisted design --- Computer-aided engineering --- Design --- Design and construction --- CAE --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics --- Data processing
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Minimizing and Exploiting Leakage in VLSI Design Nikhil Jayakumar, Suganth Paul, Rajesh Garg, Kanupriya Gulati and Sunil P. Khatri Power consumption of VLSI (Very Large Scale Integrated) circuits has been growing at an alarmingly rapid rate. This increase in power consumption, coupled with the increasing demand for portable/hand-held electronics, has made power consumption a dominant concern in the design of VLSI circuits today. Traditionally, dynamic (switching) power has dominated the total power consumption of an IC. However, due to current scaling trends, leakage power has now become a major component of the total power consumption in VLSI circuits. Leakage power reduction is especially important in portable/hand-held electronics such as cell-phones and PDAs. This book presents techniques aimed at reducing and exploiting leakage power in digital VLSI ICs. The first part of this book presents several approaches to reduce leakage in a circuit. The second part of this book shows readers how to turn the leakage problem into an opportunity, through the use of sub-threshold logic, with adaptive body bias to make the designs robust to variations. The third part of this book presents design and implementation details of a sub-threshold IC, using the ideas presented in the second part of this book. Provides a variety of approaches to control and exploit leakage, including implicit approaches to find the leakage of all input vectors in a design, techniques to find the minimum leakage vector of a design (with and without circuit modification), ASIC approaches to drastically reduce leakage, and methods to find the optimal reverse bias voltage to maximally reduce leakage. Presents a variation-tolerant, practical design methodology to implement sub-threshold logic using closed-loop adaptive body bias (ABB) and Network of PLA (NPLA) based design. In addition, asynchronous micropipelining techniques are presented, to substantially reclaim the speed penalty of sub-threshold design. Validates the proposed ABB and NPLA sub-threshold design approach by implementing a BFSK transmitter design in the proposed design style. Test results from the fabricated IC are provided as well, indicating that a power improvement of 20X can be obtained for a 0.25um process (projected power improvements are 100X to 500X for 65nm processes).
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This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors. This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems. Describes the state of the art in the areas of radiation tolerant circuit design and process variation tolerant circuit design; Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems; Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers.
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A user-friendly, pocket-sized reference for all physicians faced with endocrine care and challenges in hospitalized patients, this handbook covers the most common issues leading to an inpatient endocrine consult, providing differential diagnoses, a reasonable and practical approach to investigating and managing the condition, and advice for follow-up. Conditions discussed include thyrotoxicosis and thyroid storm, calcium disorders, osteoporosis, Cushing's syndrome, pheochromocytoma and paraganglioma, primary hyperaldosteronism, hypoglycemia in diabetic and non-diabetic patients, and endocrine issues during pregnancy, among others. Suggestions for further reading are included, providing more context for well-established clinical approaches. Written by experts with years of experience providing endocrinology consultations in a hospital setting, Handbook of Inpatient Endocrinology is a valuable, high-yield resource for endocrine residents and fellows, but it will be equally useful for any busy hospitalist or primary care physician when endocrinology consults are not available.
Endocrinology . --- Critical care medicine. --- Endocrinology. --- Intensive / Critical Care Medicine. --- Intensive care --- Intensive medicine --- Medicine --- Emergency medicine --- Intensive care units --- Internal medicine --- Hormones --- Endocrinology --- Malalties de les glàndules endocrines --- Pacients --- Endocrinologia --- Medicina interna --- Endocrinologia molecular --- Endocrinologia veterinària --- Ginecologia endocrina --- Glàndules endocrines --- Neuroendocrinologia --- Rejoveniment --- Organoteràpia --- Persones --- Relacions infermera-pacient --- Relacions metge-pacient --- Malalts --- Seguretat dels pacients --- Endocrinologia clínica --- Endocrinopaties --- Malalties endocrines --- Trastorns hormonals --- Diabetis --- Endocrinologia pediàtrica --- Hiperparatiroïdisme --- Hipoglucèmia --- Malalties de l'ovari --- Malalties de les glàndules suprarenals --- Malalties del testicle --- Pubertat precoç
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Minimizing and Exploiting Leakage in VLSI Design Nikhil Jayakumar, Suganth Paul, Rajesh Garg, Kanupriya Gulati and Sunil P. Khatri Power consumption of VLSI (Very Large Scale Integrated) circuits has been growing at an alarmingly rapid rate. This increase in power consumption, coupled with the increasing demand for portable/hand-held electronics, has made power consumption a dominant concern in the design of VLSI circuits today. Traditionally, dynamic (switching) power has dominated the total power consumption of an IC. However, due to current scaling trends, leakage power has now become a major component of the total power consumption in VLSI circuits. Leakage power reduction is especially important in portable/hand-held electronics such as cell-phones and PDAs. This book presents techniques aimed at reducing and exploiting leakage power in digital VLSI ICs. The first part of this book presents several approaches to reduce leakage in a circuit. The second part of this book shows readers how to turn the leakage problem into an opportunity, through the use of sub-threshold logic, with adaptive body bias to make the designs robust to variations. The third part of this book presents design and implementation details of a sub-threshold IC, using the ideas presented in the second part of this book. Provides a variety of approaches to control and exploit leakage, including implicit approaches to find the leakage of all input vectors in a design, techniques to find the minimum leakage vector of a design (with and without circuit modification), ASIC approaches to drastically reduce leakage, and methods to find the optimal reverse bias voltage to maximally reduce leakage. Presents a variation-tolerant, practical design methodology to implement sub-threshold logic using closed-loop adaptive body bias (ABB) and Network of PLA (NPLA) based design. In addition, asynchronous micropipelining techniques are presented, to substantially reclaim the speed penalty of sub-threshold design. Validates the proposed ABB and NPLA sub-threshold design approach by implementing a BFSK transmitter design in the proposed design style. Test results from the fabricated IC are provided as well, indicating that a power improvement of 20X can be obtained for a 0.25um process (projected power improvements are 100X to 500X for 65nm processes).
Choose an application
A user-friendly, pocket-sized reference for all physicians faced with endocrine care and challenges in hospitalized patients, this handbook covers the most common issues leading to an inpatient endocrine consult, providing differential diagnoses, a reasonable and practical approach to investigating and managing the condition, and advice for follow-up. Conditions discussed include thyrotoxicosis and thyroid storm, calcium disorders, osteoporosis, Cushing's syndrome, pheochromocytoma and paraganglioma, primary hyperaldosteronism, hypoglycemia in diabetic and non-diabetic patients, and endocrine issues during pregnancy, among others. Suggestions for further reading are included, providing more context for well-established clinical approaches. Written by experts with years of experience providing endocrinology consultations in a hospital setting, Handbook of Inpatient Endocrinology is a valuable, high-yield resource for endocrine residents and fellows, but it will be equally useful for any busy hospitalist or primary care physician when endocrinology consults are not available.
Pathological endocrinology --- Human medicine --- endocrinologie --- intensieve-zorgen afdeling
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