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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. ``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.'' John Hutchison in Journal of Microscopy ``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.'' Ray Egerton in Micron ``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.'' John C. H. Spence, Arizona State University ``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.’’ Colin Humphreys, Cambridge University ``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.’’ Ronald Gronsky, University of California, Berkeley.

Materials --- Transmission electron microscopy. --- X-ray diffractometer. --- Microscopy. --- Diffractometer, X-ray --- X-rays --- Electron microscopy --- Microscopy --- Equipment and supplies --- Surfaces (Physics). --- Crystallography. --- Engineering. --- Characterization and Evaluation of Materials. --- Surfaces and Interfaces, Thin Films. --- Crystallography and Scattering Methods. --- Solid State Physics. --- Spectroscopy and Microscopy. --- Engineering, general. --- Construction --- Industrial arts --- Technology --- Leptology --- Physical sciences --- Mineralogy --- Physics --- Surface chemistry --- Surfaces (Technology) --- Materials science. --- Materials—Surfaces. --- Thin films. --- Solid state physics. --- Spectroscopy. --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Solids --- Films, Thin --- Solid film --- Solid state electronics --- Coatings --- Thick films --- Material science --- Qualitative --- Analytical chemistry

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• Reference Manager
• EndNote
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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Materials -- Microscopy. --- Transmission electron microscopy. --- X-ray diffractometer. --- Materials --- Transmission electron microscopy --- X-ray diffractometer --- Chemical & Materials Engineering --- Physics --- Engineering & Applied Sciences --- Physical Sciences & Mathematics --- Light & Optics --- Materials Science --- Electricity & Magnetism --- Microscopy --- Microscopy. --- Diffractometer, X-ray --- Physics. --- Spectroscopy. --- Surfaces (Physics). --- Interfaces (Physical sciences). --- Thin films. --- Materials science. --- Spectroscopy and Microscopy. --- Characterization and Evaluation of Materials. --- Spectroscopy/Spectrometry. --- Surfaces and Interfaces, Thin Films. --- Surface and Interface Science, Thin Films. --- Surfaces. --- X-rays --- Electron microscopy --- Equipment and supplies --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Optics --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Surface chemistry --- Surfaces (Technology) --- Qualitative --- Spectrometry --- Materials—Surfaces. --- Surfaces (Physics) --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Coatings --- Thick films --- Material science --- Physical sciences --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Analytical chemistry

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

Materials --- Transmission electron microscopy. --- X-ray diffractometer. --- Microscopy.

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. ``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.'' John Hutchison in Journal of Microscopy ``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.'' Ray Egerton in Micron ``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.'' John C. H. Spence, Arizona State University ``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.'' Colin Humphreys, Cambridge University ``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.'' Ronald Gronsky, University of California, Berkeley

Solid state physics --- Physics --- Chemical and physical crystallography --- Materials sciences --- elektronenmicroscopie --- kristallografie --- materiaalkennis --- toegepaste wetenschappen --- spectroscopie --- fysica --- fysicochemie --- Materials --- Transmission electron microscopy --- X-ray diffractometer. --- Matériaux --- Microscopie électronique à transmission --- Diffractomètres à rayons X --- Microscopy --- Microscopie --- EPUB-LIV-FT SPRINGER-B LIVCHIMI