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Materials characterization series : surfaces, interfaces, thin films
Authors: ---
Year: 1993 Publisher: Oxford; London; Singapore Greenwich Butterworth-Heinemann Manning

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Encyclopedia of materials characterization
Authors: --- ---
ISBN: 0750691689 9780750691680 0080523609 Year: 1992 Publisher: Boston : Greenwich, CT : Butterworth-Heinemann ; Manning,

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Abstract

Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.


Book
Secondary ion mass spectrometry SIMS VII : proceedings of the seventh International Conference on Secondary Ion Mass Spectrometry (SIMS VII), Hyatt Regency Hotel, Monterey, California, USA, September 3rd-8th, 1989 ; editors : A. Benninghoven, C. A. Evans, K. D. McKeegan, H. W. Werner.
Authors: --- --- --- --- --- et al.
ISBN: 0471927384 Year: 1990 Publisher: Chichester : John Wiley & Sons,

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