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Dissertation
Magnetic random access memories : technology assessment & tunnel barrier reliability study
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Authors:
Das, Johan
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Katholieke Universiteit Leuven
ISBN: 9056824104 Year: 2003 Publisher: Leuven Katholieke Universiteit Leuven. Faculteit Toegepaste Wetenschappen
ISBN: 9056824104 Year: 2003 Publisher: Leuven Katholieke Universiteit Leuven. Faculteit Toegepaste Wetenschappen
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Keywords
621.3.049.77 --- #BIBC:T2003 --- Microelectronics. Integrated circuits --- Theses --- 621.3.049.77 Microelectronics. Integrated circuits
Dissertation
Ontwerp en realisatie van niet-vluchtige magnetische geheugens (MRAM) met bit-adressering via niet-lineaire serie-elementen
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Authors:
Das, Johan
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KUL. Faculteit toegepaste wetenschappen. Departement elektrotechniek - ESAT
Year: 1998
Year: 1998
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