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1980 (1)

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Electron microscopy 1980 : proceedings of the seventh European congress on electron microscopy, The Hague, August 24-29, 1980 incorporating the ninth international conference on x-ray optics and microanalysis was held in the Hagueorganized by the CESEM, by the Nederlandse Vereniging voor electronenmicroscopie in cooperation with the HVEM 80, organized by the Rijksuniversitair Centrum Antwerpen, under the auspices of the IFSEM
Authors: Brederoo, P. --- de Priester, W. --- Committee of European societies for electron microscopy --- Universiteit Antwerpen --- International Federation of societies for electron microscopy
Year: 1980

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Abstract

Keywords
Elektronenmicroscopie (Hoogspanning-). (Congres) --- Röntgenmicroscopie. (Congres) --- Röntgenmicroanalyse. (Congres) --- Microanalyse aux rayons X. (Congrès) --- Microscopie en rayons X. (Congrès) --- Microscopie électronique. (Congrès) --- Microscopie électronique à haute tension. (Congrès) --- Ekektronenmicroscopie. (Congres)

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