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Due to the dramatic increase in design complexity, modern circuits are often produced with functional errors. While improvements in verification allow engineers to find more errors, fixing these errors remains a manual and challenging task. Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. In addition, Functional Design Errors in Digital Circuits Diagnosis describes a comprehensive evaluation of spare-cell insertion methods. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Computer-aided design. --- Digital integrated circuits. --- Engineering. --- Logic design. --- Systems engineering. --- Digital integrated circuits --- Integrated circuits --- Electrical Engineering --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Testing --- Design and construction --- Fault tolerance --- Testing. --- Design and construction. --- Fault tolerance. --- Verification. --- Hardware verification --- Integrated circuit verification --- Verification of hardware --- Verification of integrated circuits --- Computer aided design. --- Circuits and Systems. --- Computer-Aided Engineering (CAD, CAE) and Design. --- Logic Design. --- Design, Logic --- Design of logic systems --- Digital electronics --- Electronic circuit design --- Logic circuits --- Machine theory --- Switching theory --- CAD (Computer-aided design) --- Computer-assisted design --- Computer-aided engineering --- Design --- Engineering systems --- System engineering --- Engineering --- Industrial engineering --- System analysis --- Fault tolerance (Engineering) --- Reliability --- Electronic circuits. --- Computer-aided engineering. --- CAE --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics --- Data processing
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Digital integrated circuits --- Integrated circuits --- Design and construction --- Testing --- Fault tolerance
Choose an application
Due to the dramatic increase in design complexity, modern circuits are often produced with functional errors. While improvements in verification allow engineers to find more errors, fixing these errors remains a manual and challenging task. Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. In addition, Functional Design Errors in Digital Circuits Diagnosis describes a comprehensive evaluation of spare-cell insertion methods. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
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