Narrow your search

Library

KU Leuven (2)

Odisee (2)

Thomas More Kempen (2)

Thomas More Mechelen (2)

UCLL (2)

UGent (2)

ULB (2)

ULiège (2)

VIVES (2)

AP (1)

More...

Resource type

book (3)

digital (1)


Language

English (4)


Year
From To Submit

2019 (2)

2016 (2)

Listing 1 - 4 of 4
Sort by

Book
Metrology and Physical Mechanisms in New Generation Ionic Devices
Author:
ISBN: 3319395300 3319395319 Year: 2016 Publisher: Cham : Springer International Publishing : Imprint: Springer,

Loading...
Export citation

Choose an application

Bookmark

Abstract

The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. .


Book
Electrical Atomic Force Microscopy for Nanoelectronics
Author:
ISBN: 3030156125 3030156117 Year: 2019 Publisher: Cham : Springer International Publishing : Imprint: Springer,

Loading...
Export citation

Choose an application

Bookmark

Abstract

The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.


Digital
Metrology and Physical Mechanisms in New Generation Ionic Devices
Author:
ISBN: 9783319395319 Year: 2016 Publisher: Cham Springer International Publishing

Loading...
Export citation

Choose an application

Bookmark

Abstract

The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. .


Book
Electrical Atomic Force Microscopy for Nanoelectronics
Authors: ---
ISBN: 9783030156121 Year: 2019 Publisher: Cham Springer International Publishing :Imprint: Springer

Loading...
Export citation

Choose an application

Bookmark

Abstract

Keywords

Listing 1 - 4 of 4
Sort by