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Book
Modeling nanoscale imaging in electron microscopy
Authors: --- ---
ISBN: 1489997288 146142190X 9786613702647 1280792256 1461421918 Year: 2012 Publisher: New York : Springer,

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Abstract

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Keywords

Integrated circuits -- Very large scale integration -- Design and construction. --- Metal oxide semiconductors, Complementary -- Design and construction. --- Nanoelectronics. --- Scanning transmission electron microscopy. --- Chemical & Materials Engineering --- Biology --- Health & Biological Sciences --- Engineering & Applied Sciences --- Microscopy --- Materials Science --- Electron microscopy. --- Nanoscale electronics --- Nanoscale molecular electronics --- Materials science. --- Analytical chemistry. --- Chemistry, Physical and theoretical. --- Physical measurements. --- Measurement. --- Nanotechnology. --- Materials Science. --- Characterization and Evaluation of Materials. --- Analytical Chemistry. --- Theoretical and Computational Chemistry. --- Measurement Science and Instrumentation. --- Molecular technology --- Nanoscale technology --- High technology --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Measurements, Physical --- Mathematical physics --- Measurement --- Chemistry, Theoretical --- Physical chemistry --- Theoretical chemistry --- Chemistry --- Analysis, Chemical --- Analytical chemistry --- Chemical analysis --- Metallurgical analysis --- Mineralogy, Determinative --- Material science --- Physical sciences --- Electronics --- Nanotechnology --- Surfaces (Physics). --- Analytical biochemistry. --- Chemistry. --- Physics --- Surface chemistry --- Surfaces (Technology) --- Analytic biochemistry --- Biochemistry --- Chemistry, Analytic --- Bioanalytic chemistry --- Bioanalytical chemistry --- Measurement   . --- Analytic chemistry


Multi
Modeling Nanoscale Imaging in Electron Microscopy
Authors: --- ---
ISBN: 9781461421917 Year: 2012 Publisher: Boston, MA Springer US

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Abstract

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing


Book
Modeling Nanoscale Imaging in Electron Microscopy
Authors: --- --- ---
ISBN: 9781461421917 Year: 2012 Publisher: Boston MA Springer US

Loading...
Export citation

Choose an application

Bookmark

Abstract

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing

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