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book (5)

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English (4)

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2003 (1)

1994 (1)

1990 (1)

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Oberflächentechnik
Authors: Czichos, Horst --- Vollrath, Ludwig G. E. --- Benninghoven, A.
ISBN: 3800715155 Year: 1987 Publisher: Berlin VDE-Verl.

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Secondary ion mass spectrometry SIMS IX: proceedings of the 9th International Conference on Secondary Ion Mass Spectrometry: the Hotel Yokohama and the Sangyo-Boeki Center Building Yokohama, Japan, 7-12 November, 1993
Authors: Benninghoven, A. --- Nihei, Y. --- Shimizu, R. --- International Conference on Secondary Ion Mass Spectrometry
ISBN: 0471942189 Year: 1994 Publisher: Chichester Wiley

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Spectrometric and optical chemical analysis --- fysicochemie --- Secondary ion mass spectrometry --- Spectrométrie de masse des ions secondaires --- Congresses --- Congrès --- Spectrométrie de masse des ions secondaires --- Congrès --- Spectrométrie de masse des ions secondaires. --- Spectrométrie de masse des ions secondaires.

Book

Secondary ion mass spectrometry SIMS VII: proceedings of the 7th International Conference on Secondary Ion Mass Spectrometry: Hyatt Regency Hotel, Monterey, California, September 3rd-8th,1989
Authors: Benninghoven, A. --- Evans, C.A. --- McKeegan, K.D. --- International Conference on Secondary Ion Mass Spectrometry
ISBN: 0471927384 Year: 1990 Publisher: Chichester Wiley

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Spectrometric and optical chemical analysis --- fysicochemie --- Mass spectrometry --- Spectrométrie de masse --- Secondary ion mass spectroscopy --- Spectrométrie de masse --- Spectrométrie de masse des ions secondaires --- Surfaces (physique) --- Secondary ion mass spectrometry --- Spectroscopie de masse des ions secondaires --- Actes de congrès. --- Spectrométrie de masse des ions secondaires. --- Spectrométrie de masse des ions secondaires.

Secondary ion mass spectrometry SIMS II: proceedings of the 3rd International Conference, Technical University, Budapest, Hungary, August 30-September 5,1981
Authors: Benninghoven, A. --- Giber, J. --- László, J. --- International Conference on Secondary Ion Mass Spectrometry
ISBN: 354011372X 038711372X 3642881548 3642881521 Year: 1982 Volume: 19 Publisher: Berlin Springer

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Spectrometric and optical chemical analysis --- fysicochemie --- Secondary ion mass spectroscopy --- Secondary ion mass spectrometry --- Spectrométrie de masse des ions secondaires --- Spectrométrie de masse des ions secondaires. --- Spectrométrie de masse des ions secondaires.

Book

Secondary ion mass spectrometry SIMS XIII: proceedings of the 13th International Conference on Secondary Ion Mass Spectrometry and Related Topics Nara-Ken New Public Hall, Nara, Japan, November 11-16, 2001
Authors: Benninghoven, A. --- Nihei, Y. --- Kudo, M. --- International Conference on Secondary Ion Mass Spectrometry
Year: 2003 Publisher: New York Elsevier Science

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Spectrometric and optical chemical analysis --- fysicochemie

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