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This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.
Nanotechnology. --- X-ray microanalysis. --- Molecular technology --- Nanoscale technology --- Surfaces (Physics). --- Measurement Science and Instrumentation. --- Characterization and Evaluation of Materials. --- Theoretical, Mathematical and Computational Physics. --- Applied and Technical Physics. --- Spectroscopy and Microscopy. --- Microprobe analysis --- High technology --- Physics --- Surface chemistry --- Surfaces (Technology) --- Physical measurements. --- Measurement . --- Materials science. --- Mathematical physics. --- Physics. --- Spectroscopy. --- Microscopy. --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Natural philosophy --- Philosophy, Natural --- Physical sciences --- Dynamics --- Physical mathematics --- Material science --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Measurements, Physical --- Mathematical physics --- Measurement --- Qualitative --- Analytical chemistry
Choose an application
This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.
Physics --- Measuring methods in physics --- Mathematical physics --- Optics. Quantum optics --- Physics --- Surface chemistry --- Theoretical spectroscopy. Spectroscopic techniques --- Chemical laboratory practice --- Materials sciences --- Applied physical engineering --- procescontrole --- materiaalkennis --- laboratoriuminstrumenten --- toegepaste wetenschappen --- oppervlakte-onderzoek --- theoretische fysica --- meetkundige instrumenten --- spectroscopie --- microscopie --- ingenieurswetenschappen --- fysica --- fysica --- micro-elektronica --- elektrische meettechniek
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