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Precision Landmark Location for Machine Vision and Photogrammetry : Finding and Achieving the Maximum Possible Accuracy
Authors: ---
ISBN: 1281117447 9786611117443 1846289130 1846289122 1849966745 Year: 2008 Publisher: London : Springer London : Imprint: Springer,

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Abstract

The applications of image-based measurement are many and various: image-guided surgery, mobile-robot navigation, component alignment, part inspection and photogrammetry, among others. In all these applications, landmarks are detected and located in images, and measurements made from those locations. Precision Landmark Location for Machine Vision and Photogrammetry addresses the ubiquitous problem of measurement error associated with determining the location of landmarks in images. With a detailed model of the image formation process and landmark location estimation, the Cramér–Rao Lower Bound (CRLB) theory of statistics is applied to determine the least possible measurement uncertainty in a given situation. This monograph provides the reader with: • the most complete treatment to date of precision landmark location and the engineering aspects of image capture and processing; • detailed theoretical treatment of the CRLB; • a software tool for analyzing the potential performance-specific camera/lens/algorithm configurations; • two novel algorithms which achieve precision very close to the CRLB; • an experimental method for determining the accuracy of landmark location; • downloadable MATLAB® package to assist the reader with applying theoretically-derived results to practical engineering configurations. All of this adds up to a treatment that is at once theoretically sound and eminently practical. Precision Landmark Location for Machine Vision and Photogrammetry will be of great interest to computer scientists and engineers working with and/or studying image processing and measurement. It includes cutting-edge theoretical developments and practical tools so it will appeal to research investigators and system designers.

Keywords

Computer vision. --- Photogrammetry --- Digital techniques. --- Digital photogrammetric systems --- Digital photogrammetry --- DP (Digital photogrammetry) --- DPS (Digital photogrammetric systems) --- Digital electronics --- Machine vision --- Vision, Computer --- Artificial intelligence --- Image processing --- Pattern recognition systems --- Radiology, Medical. --- Statistics. --- Image Processing and Computer Vision. --- Control, Robotics, Mechatronics. --- Remote Sensing/Photogrammetry. --- Signal, Image and Speech Processing. --- Imaging / Radiology. --- Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences. --- Clinical radiology --- Radiology, Medical --- Radiology (Medicine) --- Medical physics --- Statistical analysis --- Statistical data --- Statistical methods --- Statistical science --- Mathematics --- Econometrics --- Optical data processing. --- Control engineering. --- Robotics. --- Mechatronics. --- Remote sensing. --- Signal processing. --- Image processing. --- Speech processing systems. --- Radiology. --- Statistics . --- Radiological physics --- Physics --- Radiation --- Computational linguistics --- Electronic systems --- Information theory --- Modulation theory --- Oral communication --- Speech --- Telecommunication --- Singing voice synthesizers --- Pictorial data processing --- Picture processing --- Processing, Image --- Imaging systems --- Optical data processing --- Processing, Signal --- Information measurement --- Signal theory (Telecommunication) --- Remote-sensing imagery --- Remote sensing systems --- Remote terrain sensing --- Sensing, Remote --- Terrain sensing, Remote --- Aerial photogrammetry --- Aerospace telemetry --- Detectors --- Space optics --- Mechanical engineering --- Microelectronics --- Microelectromechanical systems --- Automation --- Machine theory --- Control engineering --- Control equipment --- Control theory --- Engineering instruments --- Programmable controllers --- Optical computing --- Visual data processing --- Bionics --- Electronic data processing --- Integrated optics --- Photonics --- Computers --- Optical equipment

Precision Landmark Location for Machine Vision and Photogrammetry : Finding and Achieving the Maximum Possible Accuracy
Authors: ---
ISBN: 9781846289132 Year: 2008 Publisher: London Springer-Verlag

Precision landmark location for machine vision and photogrammetry : finding and achieving the maximum possible accuracy.
Authors: ---
ISBN: 9781846289125 Year: 2008 Publisher: New York Springer

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Abstract

Precision Landmark Location for Machine Vision and Photogrammetry : Finding and Achieving the Maximum Possible Accuracy
Authors: --- ---
ISBN: 9781846289132 Year: 2008 Publisher: London Springer London

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Export citation

Choose an application

Bookmark

Abstract

The applications of image-based measurement are many and various: image-guided surgery, mobile-robot navigation, component alignment, part inspection and photogrammetry, among others. In all these applications, landmarks are detected and located in images, and measurements made from those locations. Precision Landmark Location for Machine Vision and Photogrammetry addresses the ubiquitous problem of measurement error associated with determining the location of landmarks in images. With a detailed model of the image formation process and landmark location estimation, the Cramér-Rao Lower Bound (CRLB) theory of statistics is applied to determine the least possible measurement uncertainty in a given situation. This monograph provides the reader with: ¢ the most complete treatment to date of precision landmark location and the engineering aspects of image capture and processing; ¢ detailed theoretical treatment of the CRLB; ¢ a software tool for analyzing the potential performance-specific camera/lens/algorithm configurations; ¢ two novel algorithms which achieve precision very close to the CRLB; ¢ an experimental method for determining the accuracy of landmark location; ¢ downloadable MATLAB® package to assist the reader with applying theoretically-derived results to practical engineering configurations. All of this adds up to a treatment that is at once theoretically sound and eminently practical. Precision Landmark Location for Machine Vision and Photogrammetry will be of great interest to computer scientists and engineers working with and/or studying image processing and measurement. It includes cutting-edge theoretical developments and practical tools so it will appeal to research investigators and system designers.

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