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This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.

X-rays --- Semiconductors. --- Crystalline semiconductors --- Semi-conductors --- Semiconducting materials --- Semiconductor devices --- Crystals --- Electrical engineering --- Electronics --- Solid state electronics --- X-ray scattering --- Scattering (Physics) --- Scattering. --- Materials

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The opportunities for doing scattering experiments at synchrotron and neutron facilities have grown rapidly in recent years and are set to continue to do so into the foreseeable future. This text provides a basic understanding of how these techniques enable the structure and dynamics of materials to be studied at the atomic and molecular level. Although mathematics cannot be avoided in a theoretical discussion, the aim has been to write a book that most scientists will still findapproachable. To this end, the first two chapters are devoted to providing a tutorial background in the mathematics

Neutrons --- X-rays --- Scattering. --- Rayons X --- Scattering --- Diffusion --- X-ray scattering --- Scattering (Physics) --- Nucleon-nucleon scattering --- Potential scattering --- scattering experiments, synchrotron facilities, neutron facilities, dynamics of materials, structure of materials

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This study provides a thorough description of the techniques involved in obtaining information about materials, including X-ray diffractometers and their associated instrument functions, data collection methods and the simulation of the patterns.

Semiconductors. --- X-rays --- X-ray scattering --- Scattering (Physics) --- Crystalline semiconductors --- Semi-conductors --- Semiconducting materials --- Semiconductor devices --- Crystals --- Electrical engineering --- Electronics --- Solid state electronics --- Scattering. --- Materials --- Electronics and optics of solids

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This thesis presents the results of resonant and non-resonant x-ray scattering experiments demonstrating the control of collective ordering phenomena in epitaxial nickel-oxide and copper-oxide based superlattices. Three outstanding results are reported: (1) LaNiO3-LaAlO3 superlattices with fewer than three consecutive NiO2 layers exhibit a novel spiral spin density wave, whereas superlattices with thicker nickel-oxide layer stacks remain paramagnetic. The magnetic transition is thus determined by the dimensionality of the electron system. The polarization plane of the spin density wave can be tuned by epitaxial strain and spatial confinement of the conduction electrons. (2) Further experiments on the same system revealed an unusual structural phase transition controlled by the overall thickness of the superlattices. The transition between uniform and twin-domain states is confined to the nickelate layers and leaves the aluminate layers unaffected. (3) Superlattices based on the high-temperature superconductor YBa2Cu3O7 exhibit an incommensurate charge density wave order that is stabilized by heterointerfaces. These results suggest that interfaces can serve as a powerful tool to manipulate the interplay between spin order, charge order, and superconductivity in cuprates and other transition metal oxides.

Transition metal oxides. --- X-rays --- Scattering. --- X-ray scattering --- Scattering (Physics) --- Metallic oxides --- Transition metal compounds --- Optical materials. --- Strongly Correlated Systems, Superconductivity. --- Spectroscopy and Microscopy. --- Optical and Electronic Materials. --- Optics --- Materials --- Superconductivity. --- Superconductors. --- Spectroscopy. --- Microscopy. --- Electronic materials. --- Electronic materials --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Superconducting materials --- Superconductive devices --- Cryoelectronics --- Electronics --- Solid state electronics --- Electric conductivity --- Critical currents --- Superfluidity --- Qualitative --- Analytical chemistry

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This book is the first comprehensive introduction to X-ray and neutron reflectivity techniques and illustrates them with many examples. After a pedagogical introduction on the interaction of X-rays and neutrons with matter, the interplay between the statistics of rough surfaces and interfaces and the scattering of radiation is considered in detail. Specular reflectivity and diffuse scattering are discussed next , in chapters 3 and 4 . The approximations are rigorously introduced and many experimental effects are discussed. The specific aspects of neutron reflectivity require separate treatment, given in chapter 5. Chapter 6 turns to X-ray reflectivity by rough multilayers. Eventually, chapter 7 introduces and discusses the by now well-established method of grazing incidence small angle X-ray scattering to investigate nanostructures. For the second edition, the material has been completely reorganized so as to meet the demand for a modern multi-author textbook for PhD students and young researchers. All chapters have further been thoroughly revised, updated and, where appropriate, suitably augmented. The first edition was been published as Lect. Notes Phys. m58 in the same series.

X-rays --- Neutrons --- Atomic Physics --- Light & Optics --- Physics --- Physical Sciences & Mathematics --- Scattering --- Scattering. --- X-ray scattering --- Physics. --- Solid state physics. --- Spectroscopy. --- Microscopy. --- Materials science. --- Materials --- Thin films. --- Solid State Physics. --- Spectroscopy and Microscopy. --- Surfaces and Interfaces, Thin Films. --- Characterization and Evaluation of Materials. --- Surfaces. --- Nucleon-nucleon scattering --- Potential scattering --- Scattering (Physics) --- Surfaces (Physics). --- Surface chemistry --- Surfaces (Technology) --- Materials—Surfaces. --- Material science --- Physical sciences --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Coatings --- Thick films --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Qualitative --- Analytical chemistry