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Atom-probe field ion microscopy --- Crystallography --- Field ion microscopy --- Leptology --- Physical sciences --- Mineralogy --- Experimental solid state physics --- Applied chemical analysis --- Materials sciences

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The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three­ dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three­ dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.

Atom-probe field ion microscopy. --- Tomography. --- Microscopie ionique à champ et sonde atomique --- Scanographie --- Microscopie ionique à champ et sonde atomique --- Atom-probe field ion microscopy --- Tomography --- Body section radiography --- Computed tomography --- Computerized tomography --- CT (Computer tomography) --- Laminagraphy --- Laminography --- Radiological stratigraphy --- Stratigraphy, Radiological --- Tomographic imaging --- Zonography --- Computer tomography --- CT (Computed tomography) --- Cross-sectional imaging --- Radiography, Medical --- Geometric tomography --- Field ion microscopy --- Materials science. --- Metals. --- Characterization and Evaluation of Materials. --- Metallic Materials. --- Metallic elements --- Chemical elements --- Ores --- Metallurgy --- Material science --- Physical sciences

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Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century. Topics covered include the principles, operation, and performance of the Gaseous Field Ion Source (GFIS), and a comparison of the optics of ion and electron beam microscopes including their operating conditions, resolution, and signal-to-noise performance. The physical principles of Ion-Induced Secondary Electron (iSE) generation by ions are discussed, and an extensive database of iSE yields for many elements and compounds as a function of incident ion species and its energy is included. Beam damage and charging are frequently outcomes of ion beam irradiation, and techniques to minimize such problems are presented. In addition to imaging, ions beams can be used for the controlled deposition, or removal, of selected materials with nanometer precision. The techniques and conditions required for nanofabrication are discussed and demonstrated. Finally, the problem of performing chemical microanalysis with ion beams is considered. Low energy ions cannot generate X-ray emissions, so alternative techniques such as Rutherford Backscatter Imaging (RBI) or Secondary Ion Mass Spectrometry (SIMS) are examined. Serves as a concise but authoritative introduction to the latest innovation in scanning microscopy Compares ion and electron beams as options for microscopy Presents a detailed physical model of ion-solid interactions and signal generation Provides a detailed database of iSE yield behavior as a function of the target ion, element, and energy.

Optics. Quantum optics --- Physics --- Surface chemistry --- Theoretical spectroscopy. Spectroscopic techniques --- Spectrometric and optical chemical analysis --- Materials sciences --- Electrical engineering --- Applied physical engineering --- materiaalkennis --- oppervlakte-onderzoek --- nanotechniek --- spectroscopie --- microscopie --- spectrometrie --- Field ion microscopy. --- Helium ions. --- Ion bombardment.

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Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. Provides the most practical, up-to-date and critical review of  atom probe microscopy techniques Presents a detailed description of the analysis tools Includes practical examples of how the technique can be used in materials science research Stands as a must-have reference for any user of atom probe microscopy.

Atomic force microscopy. --- Atom-probe field ion microscopy. --- Scanning probe microscopy. --- Atomic force microscopy --- Scanning probe microscopy --- Atom-probe field ion microscopy --- Biology --- Chemical & Materials Engineering --- Engineering & Applied Sciences --- Health & Biological Sciences --- Microscopy --- Materials Science --- Surfaces (Physics). --- Nanochemistry. --- Nanotechnology. --- Characterization and Evaluation of Materials. --- Nanoscale Science and Technology. --- Spectroscopy and Microscopy. --- Field ion microscopy --- Molecular technology --- Nanoscale technology --- High technology --- Nanoscale chemistry --- Chemistry, Analytic --- Nanoscience --- Physics --- Surface chemistry --- Surfaces (Technology) --- Analytical chemistry --- Materials science. --- Nanoscale science. --- Nanoscience. --- Nanostructures. --- Spectroscopy. --- Microscopy. --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Nano science --- Nanoscale science --- Nanosciences --- Science --- Material science --- Physical sciences --- Qualitative

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This book aims to provide an introduction and overview of atom-probe tomography from a materials science perspective, a full introduction to underlying theory and to current understanding of the theory of laser-pulsed APT, and a careful account of how to prepare specimens, set up the appropriate conditions for tomography, analyse the experimental data, and present results. A special feature of this book is that it includes an updated historical account of the development of the underlying theory (including field evaporation), allowing readers to appreciate how theoretical understanding of the science behind the technique reached its present state.  This book is ideal for:  ·         beginners as well as more experienced researchers and scientists ·         those interested mainly in using the pulsed-laser local electrode atom probe for materials science ·         those interested in developing the technique and understanding the details of how it works.

Tomography. --- Atom-probe field ion microscopy. --- Field ion microscopy --- Body section radiography --- Computed tomography --- Computerized tomography --- CT (Computer tomography) --- Laminagraphy --- Laminography --- Radiological stratigraphy --- Stratigraphy, Radiological --- Tomographic imaging --- Zonography --- Cross-sectional imaging --- Radiography, Medical --- Geometric tomography --- Surfaces (Physics). --- Nanotechnology. --- Characterization and Evaluation of Materials. --- Solid State Physics. --- Spectroscopy and Microscopy. --- Molecular technology --- Nanoscale technology --- High technology --- Physics --- Surface chemistry --- Surfaces (Technology) --- Materials science. --- Solid state physics. --- Spectroscopy. --- Microscopy. --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Solids --- Material science --- Physical sciences --- Qualitative --- Analytical chemistry