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Photo-electron spectra induced by X-rays of above 600 non-metallic compounds containing 77 elements
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ISBN: 8773040142 9788773040140 Year: 1972 Publisher: København Munksgaard

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The photoelectron spectroscopy of molecules.
ISBN: 0901886033 Year: 1972 Publisher: London : Chemical society. Faraday division,

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NIST x-ray photoelectron spectroscopy (XPS) database
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Year: 1990 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Auger electron spectroscopy
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ISBN: 160650682X 9781606506820 9781606506813 1606506811 Year: 2015 Publisher: New York [New York] (222 East 46th Street, New York, NY 10017)

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Auger electron spectroscopy (AES) is capable of providing elemental composition and, in some restricted cases, chemical bonding information for the elements present near the surface of solid materials. The surface specificity of this technique is such that only atoms in the top 5 to 10 nm are detected. The great strength of AES is its ability to provide this information with excellent spatial resolution (down to <10 nm). It can be used to provide elemental maps of the surface, which gives rise to the term scanning Auger microscopy (SAM). When used in combination with a source of high-energy ions, it provides elemental depth profiles to depths of up to a few micrometers. The use of AES and SAM for the characterization of a wide range of technological materials is discussed. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high- resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, and X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed.

Electron spectroscopy of crystals
Authors: --- --- --- ---
ISBN: 0306401096 1461329035 1461329019 Year: 1979 Publisher: New York London : Plenum Press,


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Secondary electron spectra from dielectric theory
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ISBN: 8773041068 9788773041062 Year: 1980 Publisher: København Munksgaard

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Surface and thin film analysis : a compendium of principles, instrumentation, and applications
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ISBN: 9783527320479 Year: 2011 Publisher: Weinheim : Wiley-VCH,

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Modern ESCA : the principles and practice of X-ray photoelectron spectroscopy
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ISBN: 0849386535 9780849386534 Year: 1994 Publisher: Boca Raton : CRC Press,


Book
Applied electron spectroscopy for chemical analysis
Authors: ---
ISBN: 0471090514 Year: 1982 Publisher: New York (N.Y.): Wiley


Periodical
Journal of electron spectroscopy and related phenomena
ISSN: 03682048 18732526 Publisher: Amsterdam

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