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Book
2022 OPJU International Technology Conference on Emerging Technologies for Sustainable Development (OTCON)
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ISBN: 1665492945 1665492953 Year: 2023 Publisher: Piscataway, New Jersey : IEEE,

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Machine learning


Book
2023 IEEE Conference on Secure and Trustworthy Machine Learning (SaTML)
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ISBN: 166546299X 1665463007 Year: 2023 Publisher: Los Alamitos, California : IEEE,

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Abstract

This conference will expand on the theoretical and practical understandings of vulnerabilities inherent to ML systems, explore the robustness of ML algorithms and systems, and aid in developing a unified, coherent scientific community which aims to build trustworthy ML systems.

Keywords

Machine learning


Book
2023 IEEE/ACM International Workshop on Equitable Data & Technology (FairWare)
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ISBN: 9798350312010 9798350312027 Year: 2023 Publisher: Piscataway, NJ : IEEE,

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Keywords

Machine learning


Book
2023 IEEE International Conference on Acoustics, Speech, and Signal Processing Workshops (ICASSPW)
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ISBN: 9798350302615 9798350302622 Year: 2023 Publisher: Piscataway, NJ : IEEE,

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Keywords

Machine learning


Book
Machine Learning for Brain Disorders
Author:
ISBN: 1071631950 1071631942 Year: 2023 Publisher: New York : Springer US,

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Abstract

This work provides readers with an up-to-date and comprehensive guide to both methodological and applicative aspects of machine learning (ML) for brain disorders. The chapters in this book are organized into five parts. Part One presents the fundamentals of ML. Part Two looks at the main types of data used to characterize brain disorders, including clinical assessments, neuroimaging, electro- and magnetoencephalography, genetics and omics data, electronic health records, mobile devices, connected objects and sensors. Part Three covers the core methodologies of ML in brain disorders and the latest techniques used to study them. Part Four is dedicated to validation and datasets, and Part Five discusses applications of ML to various neurological and psychiatric disorders.


Book
Trustworthy Machine Learning for Healthcare : First International Workshop, TML4H 2023, Virtual Event, May 4, 2023, Proceedings
Authors: ---
ISBN: 3031395395 3031395387 Year: 2023 Publisher: Cham : Springer Nature Switzerland : Imprint: Springer,

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This book constitutes the proceedings of First International Workshop, TML4H 2023, held virtually, in May 2023. The 16 full papers included in this volume were carefully reviewed and selected from 30 submissions. The goal of this workshop is to bring together experts from academia, clinic, and industry with an insightful vision of promoting trustworthy machine learning in healthcare in terms of scalability, accountability, and explainability.


Book
2023 International Conference in Advances in Power, Signal, and Information Technology (APSIT)
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ISBN: 9798350339369 9798350339376 Year: 2023 Publisher: Piscataway, New Jersey : IEEE,

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Keywords

Machine learning


Book
Ophthalmic Medical Image Analysis : 10th International Workshop, OMIA 2023, Held in Conjunction with MICCAI 2023, Vancouver, BC, Canada, October 12, 2023, Proceedings
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ISBN: 3031440137 3031440129 Year: 2023 Publisher: Cham, Switzerland : Springer Nature Switzerland AG,

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Book
61691-1-1-2023 - IEEE/IEC International Standard--Behavioural languages--Part 1-1 : VHDL Language Reference Manual
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ISBN: 9798855702217 Year: 2023 Publisher: New York, USA : IEEE,

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Abstract

VHSIC Hardware Description Language (VHDL) is defined. VHDL is a formal notation intended for use in all phases of the creation of electronic systems. Because it is both machine readable and human readable, it supports the development, verification, synthesis, and testing of hardware designs; the communication of hardware design data; and the maintenance, modification, and procurement of hardware. Its primary audiences are the implementors of tools supporting the language and the advanced users of the language.

Keywords

Machine learning


Book
2023 IEEE 33rd International Workshop on Machine Learning for Signal Processing (MLSP)
Author:
ISBN: 9798350324112 9798350324129 Year: 2023 Publisher: IEEE

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Keywords

Machine learning

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