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2020 Annual Reliability and Maintainability Symposium (RAMS)
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ISBN: 1728136903 1728136911 Year: 2020 Publisher: [Place of publication not identified] : Institute of Electrical and Electronics Engineers,

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Tutorials and original papers on reliability, maintainability, safety, and risk management.


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Multistate system reliability with dependencies
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ISBN: 9780128226247 0128226242 9780128212608 0128212608 Year: 2020 Publisher: London : Academic Press,

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2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling (APARM)
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ISBN: 1728171032 1728171024 Year: 2020 Publisher: Piscataway, NJ : IEEE,

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2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)
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ISBN: 1728177359 1728177367 9781728177359 Year: 2020 Publisher: Piscataway, NJ : IEEE,

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The annual International Symposium on Software Reliability Engineering (ISSRE) is focused on innovative techniques and tools for assessing, predicting, and improving the reliability, safety, and security of software products ISSRE will be celebrating its 31th edition in Coimbra, Portugal, and will continue to emphasize scientific methods, industrial relevance, rigorous empirical validation and shared value of practical tools and experiences as paper selection criteria.


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2019 6th International Conference on Dependable Systems and Their Applications (DSA)
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ISBN: 172816057X 1728160588 Year: 2020 Publisher: [Place of publication not identified] : Institute of Electrical and Electronics Engineers,

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2020 16th International Conference on the Design of Reliable Communication Networks DRCN 2020
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ISBN: 1728163005 1728163013 9781728163000 Year: 2020 Publisher: Piscataway, New Jersey : IEEE,

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2020 50th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)
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ISBN: 1728158095 1728158109 Year: 2020 Publisher: Piscataway, New Jersey : IEEE,

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The Annual IEEE IFIP International Conference on Dependable Systems and Networks (DSN) has pioneered the fusion between dependability and security research, understanding the need to simultaneously fight against accidental faults, intentional cyber attacks, design errors, and unexpected operating conditions Its distinctive approach to both accidental and malicious faults made DSN the most prestigious international forum for presenting research furthering robustness and resilience of today s wide spectrum of computing systems and networks, with dependability embracing security aspects under a common body of knowledge All aspects on the research and practice of dependability and applied security are within the scope of DSN, including innovative architectures, protocols and algorithms, as well as experimentation with and assessment of dependable and secure systems and networks.


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2020 8th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)
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ISBN: 1728170168 1728170176 Year: 2020 Publisher: Piscataway, New Jersey : IEEE,

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2020 16th European Dependable Computing Conference (EDCC)
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ISBN: 1728189365 1728189373 9781728189369 Year: 2020 Publisher: Los Alamitos, CA : IEEE,

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"2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)"
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ISBN: 172816169X 9781728161693 1728161703 Year: 2020 Publisher: IEEE

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The 27th edition of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2020) will be held at the Marina Bay Sands Convention Center in Singapore from July 20 23 IPFA will continue to focus on the fundamental understanding of the electrical and physical characterization techniques and associated technologies that assist in probing the nature of wear out and failure in conventional and new CMOS devices, in turn resulting in improved knowhow of the physics of device circuit module failure that serves as critical input for future design for reliability We are also soliciting submissions in new and upcoming areas of research that include failure analysis for hardware security, reliability and failure analysis of power electronics, photovoltaic technologies as well as 2D Nanodevices and applications of machine learning and artificial intelligence to the field of failure analysis and reliability assessment.

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