Listing 1 - 10 of 248 | << page >> |
Sort by
|
Choose an application
Tutorials and original papers on reliability, maintainability, safety, and risk management.
Choose an application
Choose an application
Reliability (Engineering) --- Computer systems --- Reliability
Choose an application
The annual International Symposium on Software Reliability Engineering (ISSRE) is focused on innovative techniques and tools for assessing, predicting, and improving the reliability, safety, and security of software products ISSRE will be celebrating its 31th edition in Coimbra, Portugal, and will continue to emphasize scientific methods, industrial relevance, rigorous empirical validation and shared value of practical tools and experiences as paper selection criteria.
Computer software --- Reliability (Engineering) --- Reliability
Choose an application
Choose an application
Choose an application
The Annual IEEE IFIP International Conference on Dependable Systems and Networks (DSN) has pioneered the fusion between dependability and security research, understanding the need to simultaneously fight against accidental faults, intentional cyber attacks, design errors, and unexpected operating conditions Its distinctive approach to both accidental and malicious faults made DSN the most prestigious international forum for presenting research furthering robustness and resilience of today s wide spectrum of computing systems and networks, with dependability embracing security aspects under a common body of knowledge All aspects on the research and practice of dependability and applied security are within the scope of DSN, including innovative architectures, protocols and algorithms, as well as experimentation with and assessment of dependable and secure systems and networks.
Choose an application
Choose an application
Choose an application
The 27th edition of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2020) will be held at the Marina Bay Sands Convention Center in Singapore from July 20 23 IPFA will continue to focus on the fundamental understanding of the electrical and physical characterization techniques and associated technologies that assist in probing the nature of wear out and failure in conventional and new CMOS devices, in turn resulting in improved knowhow of the physics of device circuit module failure that serves as critical input for future design for reliability We are also soliciting submissions in new and upcoming areas of research that include failure analysis for hardware security, reliability and failure analysis of power electronics, photovoltaic technologies as well as 2D Nanodevices and applications of machine learning and artificial intelligence to the field of failure analysis and reliability assessment.
Listing 1 - 10 of 248 | << page >> |
Sort by
|