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2019 (3)

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1505.1-2019 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
Author: Institute of Electrical and Electronics Engineers
ISBN: 150445975X Year: 2019 Publisher: [Place of publication not identified] : IEEE,

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Keywords
Automatic test equipment.

Book

2019 IEEE AUTOTESTCON
Author: Institute of Electrical and Electronics Engineers
ISBN: 1728128323 1728128331 9781728128320 Year: 2019 Publisher: Piscataway, NJ : IEEE,

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Automatic test equipment

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2019 Prognostics and System Health Management Conference : 2-5 May 2019, Paris, France
Authors: Prognostics and System Health Management Conference --- Institute of Electrical and Electronics Engineers
ISBN: 1728103290 1728103304 Year: 2019 Publisher: Piscataway, New Jersey : Institute of Electrical and Electronics Engineers,

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Reliability (Engineering) --- Automatic test equipment --- Electronic systems --- Testing --- Systems, Electronic --- Electronic apparatus and appliances --- Electronics

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