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Electronic circuits --- Electronic systems --- Testing --- Design and construction --- Systems, Electronic --- Electronic apparatus and appliances --- Electronics --- Electron-tube circuits --- Electric circuits --- Electron tubes

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This book discusses analytical approaches and modeling of the breakdown voltage (BV) effects on graphene-based transistors. It presents semi-analytical models for lateral electric field, length of velocity saturation region (LVSR), ionization coefficient (α), and breakdown voltage (BV) of single and double-gate graphene nanoribbon field effect transistors (GNRFETs). The application of Gauss’s law at drain and source regions is employed in order to derive surface potential and lateral electric field equations. LVSR is then calculated as a solution of surface potential at saturation condition. The ionization coefficient is modelled and calculated by deriving equations for probability of collisions in ballistic and drift modes based on the lucky drift theory of ionization. The threshold energy of ionization is computed using simulation and an empirical equation is derived semi-analytically. Lastly avalanche breakdown condition is employed to calculate the lateral BV. On the basis of this, simple analytical and semi-analytical models are proposed for the LVSR and BV, which could be used in the design and optimization of semiconductor devices and sensors. The proposed equations are used to examine BV at different channel lengths, supply voltages, oxide thickness, GNR widths, and gate voltages. Simulation results show that the operating voltage of FETs could be as low as 0.25 V in order to prevent breakdown. However, after optimization, it can go as high as 1.5 V. This work is useful for researchers working in the area of graphene nanoribbon-based transistors.

Engineering. --- Electronic circuits. --- Nanotechnology. --- Nanotechnology and Microengineering. --- Electronic Circuits and Devices. --- Field-effect transistors --- Materials. --- Unipolar transistors --- Transistors --- Molecular technology --- Nanoscale technology --- High technology --- Construction --- Industrial arts --- Technology --- FETs (Transistors) --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics

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This book gathers a collection of papers by international experts presented at the International Conference on NextGen Electronic Technologies (ICNETS2-2017), which cover key developments in the field of electronics and communication engineering. ICNETS2 encompassed six symposia covering all aspects of the electronics and communications domains, including relevant nano/micro materials and devices. This book showcases the latest research in very-large-scale integration (VLSI) Design: Circuits, Systems and Applications, making it a valuable resource for all researchers, professionals, and students working in the core areas of electronics and their applications, especially in digital and analog VLSI circuits and systems.

Engineering. --- Microprogramming. --- Electronic circuits. --- Circuits and Systems. --- Electronic Circuits and Devices. --- Control Structures and Microprogramming. --- Systems engineering. --- Computer programming --- Engineering systems --- System engineering --- Engineering --- Industrial engineering --- System analysis --- Design and construction --- Microprogramming . --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics

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Wireless communication systems. --- Electronic circuits. --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics --- Communication systems, Wireless --- Wireless data communication systems --- Wireless information networks --- Wireless telecommunication systems --- Telecommunication systems --- Wireless communication systems --- Electronic circuits

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This book describes in detail all required technologies and methodologies needed to create a comprehensive, functional design verification strategy and environment to tackle the toughest job of guaranteeing first-pass working silicon The author outlines all of the verification sub-fields at a high level, with just enough depth to allow a manager/decision maker or an engineer to grasp the field which can then be pursued in detail with the provided references. He describes in detail industry standard technologies such as UVM (Universal Verification Methodology), SVA (SystemVerilog Assertions), SFC (SystemVerilog Functional Coverage), CDV (Coverage Driven Verification), Low Power Verification (Unified Power Format UPF), AMS (Analog Mixed Signal) verification, Virtual Platform TLM2.0/ESL (Electronic System Level) methodology, Static Formal Verification, Logic Equivalency Check (LEC), Hardware Acceleration, Hardware Emulation, Hardware/Software Co-verification, Power Performance Area (PPA) analysis on a virtual platform, Reuse Methodology from Algorithm/ESL to RTL, and other overall methodologies.

Engineering. --- Logic design. --- Microprocessors. --- Electronic circuits. --- Circuits and Systems. --- Processor Architectures. --- Logic Design. --- Systems engineering. --- Computer science. --- Informatics --- Science --- Engineering systems --- System engineering --- Engineering --- Industrial engineering --- System analysis --- Design, Logic --- Design of logic systems --- Digital electronics --- Electronic circuit design --- Logic circuits --- Machine theory --- Switching theory --- Design and construction --- Minicomputers --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics