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Sound --- Multimedia systems --- Digital video --- Acoustics --- Continuum mechanics --- Mathematical physics --- Physics --- Pneumatics --- Radiation --- Wave-motion, Theory of --- Recording and reproducing --- Digital techniques

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Spectrum analysis. --- Spectral imaging. --- Imaging spectroscopy --- Optical spectroscopy --- Photography --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Optics --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Digital techniques --- Qualitative --- Analytical chemistry

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The study of radiation effects has developed as a major field of materials science from the beginning, approximately 70 years ago. Its rapid development has been driven by two strong influences. The properties of the crystal defects and the materials containing them may then be studied. The types of radiation that can alter structural materials consist of neutrons, ions, electrons, gamma rays or other electromagnetic waves with different wavelengths. All of these forms of radiation have the capability to displace atoms/molecules from their lattice sites, which is the fundamental process that drives the changes in all materials. The effect of irradiation on materials is fixed in the initial event in which an energetic projectile strikes a target. The book is distributed in four sections: Ionic Materials; Biomaterials; Polymeric Materials and Metallic Materials.

Spectrum analysis. --- Mass spectrometry. --- Mass spectra --- Mass spectrograph --- Mass spectroscopy --- Mass spectrum analysis --- Mass (Physics) --- Nuclear spectroscopy --- Spectrum analysis --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Analytical chemistry --- Interferometry --- Optics --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Qualitative --- Nuclear chemistry, photochemistry & radiation

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Fifth volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about X-ray and Neutron Techniques for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

Optics. Quantum optics --- Theoretical spectroscopy. Spectroscopic techniques --- Materials sciences --- Electrical engineering --- materiaalkennis --- nanotechniek --- spectroscopie --- spectrometrie --- Nanotechnology. --- Spectroscopy. --- Spectroscopy/Spectrometry. --- Molecular technology --- Nanoscale technology --- High technology --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Optics --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Qualitative --- Spectrometry --- Analytical chemistry --- Spectrum analysis.

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Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from subnanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. It follows in the footsteps of two previous books written by one of the authors with important updates to emphasize modern instrumentation and applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.

Ellipsometry. --- Thin films --- Spectrum analysis --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Optics --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Surfaces (Technology) --- Coatings --- Thick films --- Polarimetry --- Polarization (Light) --- Measurement. --- Qualitative --- Cauchy equation --- dispersion equations --- ellipsometry --- optical constants --- polarized light --- refractive index --- thin film thickness --- Analytical chemistry