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Secondary ion mass spectrometry : an introduction to principles and practices
Author: Heide, Paul van der
ISBN: 9781118480489 1118480481 Year: 2014 Publisher: Hoboken, New Jersey : John Wiley & Sons, Inc.,

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Abstract
"This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications".

Keywords
Secondary ion mass spectrometry. --- Spectrométrie de masse des ions secondaires --- Spectrométrie de masse des ions secondaires.

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