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2012 (3)

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Book
2012 IEEE International Interconnect Technology Conference
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ISBN: 1467311383 1467311367 1467311375 Year: 2012 Publisher: [Place of publication not identified] IEEE


Book
Compact models and measurement techniques for high-speed interconnects
Authors: ---
ISBN: 1461410703 9786613705112 1461410711 1280794720 Year: 2012 Publisher: New York : Springer,

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Abstract

Compact Models and Measurement Techniques for High-Speed Interconnects provides detailed analysis of issues related to high-speed interconnects from the perspective of modeling approaches and measurement techniques. Particular focus is laid on the unified approach (variational method combined with the transverse transmission line technique) to develop efficient compact models for planar interconnects. This book will give a qualitative summary of the various reported modeling techniques and approaches and will help researchers and graduate students with deeper insights into interconnect models in particular and interconnect in general. Time domain and frequency domain measurement techniques and simulation methodology are also explained in this book.


Book
Variation tolerant on-chip interconnects
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ISBN: 1461401305 9786613443922 1283443929 1461401313 1489990860 Year: 2012 Publisher: New York : Springer,

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Abstract

This book presents design techniques, analysis and implementation of high performance and power efficient, variation tolerant on-chip interconnects.  Given the design paradigm shift to multi-core, interconnect-centric designs and the increase in sources of variability and their impact in sub-100nm technologies, this book will be an invaluable reference for anyone concerned with the design of next generation, high-performance electronics systems. Provides comprehensive, circuit-level explanation of high-performance, energy-efficient, variation-tolerant on-chip interconnect; Describes design techniques to mitigate problems caused by variation; Includes techniques for design and implementation of self-timed on-chip interconnect, delay variation insensitive communication protocols, high speed signaling techniques and circuits, bit-width independent completion detection and process, voltage and temperature variation tolerance.                          .

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