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Year: 2008 Publisher: Washington, D.C. : Oak Ridge, Tenn. : United States. Dept. of Energy ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,
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Integrated circuits --- Microelectronics industry --- Quality control --- Semiconductors --- Semiconductor wafers --- Defects --- Analysis --- Design and construction
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ISBN: 9783527320349 3527320342 Year: 2008 Publisher: Weinheim Wiley-VCH
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Three-dimensional integrated circuits. --- Integrated circuits --- Semiconductor wafers. --- Three-dimensional imaging. --- Design and construction. --- Semiconductor wafers --- Three-dimensional imaging --- Three-dimensional integrated circuits --- 3D ICs (Three-dimensional integrated circuits) --- 3-D imaging --- 3D imaging --- Three-dimensional imaging systems --- Three-dimensional imaging techniques --- Three-dimensional visualization --- Visualization, Three-dimensional --- Imaging systems --- Wafers, Semiconductor --- Microelectronics --- Design and construction
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