Narrow your search

Library

KU Leuven (5)

LUCA School of Arts (5)

Odisee (5)

Thomas More Kempen (5)

Thomas More Mechelen (5)

UCLL (5)

ULiège (5)

VIVES (5)

ULB (3)

VUB (3)

More...

Resource type

book (8)

dissertation (1)

film (1)


Language

English (9)


Year
From To Submit

2007 (9)

Listing 1 - 9 of 9
Sort by

Dissertation
Quantum transport beyond the effective mass approximation.
Author:
ISBN: 3866281498 Year: 2007 Publisher: Konstanz Hartung-Gorre

Loading...
Export citation

Choose an application

Bookmark

Abstract

MOSFET modeling for circuit analysis and design
Authors: ---
ISBN: 1281120871 9786611120870 981270759X 9789812707598 9812568107 9789812568106 Year: 2007 Publisher: Singapore Hackensack, NJ World Scientific

Loading...
Export citation

Choose an application

Bookmark

Abstract

This is the first book dedicated to the next generation of MOSFET models. Addressed to circuit designers with an in-depth treatment that appeals to device specialists, the book presents a fresh view of compact modeling, having completely abandoned the regional modeling approach. Both an overview of the basic physics theory required to build compact MOSFET models and a unified treatment of inversion-charge and surface-potential models are provided. The needs of digital, analog and RF designers as regards the availability of simple equations for circuit designs are taken into account. Compact ex

Modeling and characterization of RF and microwave power FETs
Authors: --- ---
ISBN: 9780521870665 9780511541124 9780521336178 Year: 2007 Publisher: Cambridge Cambridge University Press

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
Modeling and characterization of RF and microwave power FETs
Authors: --- ---
ISBN: 1107180066 1281243647 9786611243647 051137822X 0511376731 051137576X 0511374852 0511541120 0511378513 Year: 2007 Publisher: Cambridge : Cambridge University Press,

Loading...
Export citation

Choose an application

Bookmark

Abstract

This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.

Mosfet modeling for VLSI simulation
Author:
ISBN: 128112088X 9786611120887 9812707581 9789812707581 9789812568625 981256862X Year: 2007 Publisher: New Jersey World Scientific

Loading...
Export citation

Choose an application

Bookmark

Abstract

A reprint of the classic text, this book popularized compact modeling of electronic and semiconductor devices and components for college and graduate-school classrooms, and manufacturing engineering, over a decade ago. The first comprehensive book on MOS transistor compact modeling, it was the most cited among similar books in the area and remains the most frequently cited today. The coverage is device-physics based and continues to be relevant to the latest advances in MOS transistor modeling. This is also the only book that discusses in detail how to measure device model parameters required

Power management of digital circuits in deep sub-micron CMOS technologies
Author:
ISBN: 1280724722 9786610724727 140205081X 1402050801 9781402050800 Year: 2007 Publisher: Berlin ; [London] : Springer,

Loading...
Export citation

Choose an application

Bookmark

Abstract

In the deep sub-micron regime, the power consumption has become one of the most important issues for competitive design of digital circuits. Due to dramatically increasing leakage currents, the power consumption does not take advantage of technology scaling as before. State-of-art power reduction techniques like the use of multiple supply and threshold voltages, transistor stack forcing and power gating are discussed with respect to implementation and power saving capability. Focus is given especially on technology dependencies, process variations and technology scaling. Design and implementation issues are discussed with respect to the trade-off between power reduction, performance degradation, and system level constraints. A complete top-down design flow is demonstrated for power gating techniques introducing new design methodologies for the switch sizing task and circuit blocks for data-retention and block activation. The leakage reduction ratio and the minimum power-down time are introduced as figures of merit to describe the power gating technique on system level and give a relation to physical circuit parameters. Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies mainly deals with circuit design but also addresses the interface between circuit and system level design on the one side and between circuit and physical design on the other side.

Advanced gate stacks for high-mobility semiconductors
Author:
ISBN: 1281179302 9786611179304 354071491X 3540714901 3642090710 9783540714903 Year: 2007 Publisher: Berlin : Springer,

Loading...
Export citation

Choose an application

Bookmark

Abstract

Will nanoelectronic devices continue to scale according to Moore’s law? At this moment, there is no easy answer since gate scaling is rapidly emerging as a serious roadblock for the evolution of CMOS technology. Channel engineering based on high-mobility semiconductor materials (e.g. strained Si, alternative orientation substrates, Ge or III-V compounds) could help overcome the obstacles since they offer performance enhancement. There are several concerns though. Do we know how to make complex engineered substrates (e.g. Germanium-on-Insulator)? Which are the best interface passivation methodologies and (high-k) gate dielectrics on Ge and III-V compounds? Can we process these materials in short channel transistors using flows, toolsets and know how similar to that in Si technology? How do these materials and devices behave at the nanoscale? The reader will get a clear view of what has been done so far, what is the state-of-the-art and which are the main challenges ahead before we come any close to a viable Ge and III-V MOS technology.


Multi
Process technology

Loading...
Export citation

Choose an application

Bookmark

Abstract

This tutorial will discuss the requirements and transistor design issues in current and future low power technologies. After reviewing the trade-offs between low standby and low active power the methods for and required future innovations in low power process and transistor design will be discussed.

Low-frequency noise in advanced MOS devices
Authors: ---
ISBN: 128110275X 9786611102753 1402059108 1402059094 9048174724 Year: 2007 Publisher: Dordrecht : Springer,

Loading...
Export citation

Choose an application

Bookmark

Abstract

Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-frequency (1/f) noise models in MOS transistors are treated extensively providing an in-depth understanding of the low-frequency noise mechanisms and the potential sources of the noise in MOS transistors. Advanced CMOS technology including nanometer scaled devices, strained Si, SiGe, SOI, high-k gate dielectrics, multiple gates and metal gates are discussed from a low-frequency noise point of view. Some of the most recent publications and conference presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits.

Listing 1 - 9 of 9
Sort by