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2007 (131)

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Book
Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on
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ISBN: 1424417287 1424417279 1509090002 Year: 2007 Publisher: Piscataway, New Jersey : Institute of Electrical and Electronics Engineers,

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Keywords

Semiconductors


Book
Semiconductor Device Research Symposium, 2007 International
Author:
ISBN: 1424418925 1424418917 1509089934 Year: 2007 Publisher: Piscataway, NJ : IEEE,

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Keywords

Semiconductors


Book
2007 ROCS Workshop : proceedings : October 14, 2007, Portland, Oregon.
Author:
Year: 2007 Publisher: New York : IEEE,

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Keywords

Semiconductors


Book
2007 ROCS Workshop : proceedings : October 14, 2007, Portland, Oregon.
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Year: 2007 Publisher: New York : IEEE,

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Semiconductors

Extended defects in semiconductors
Authors: ---
ISBN: 9780521819343 9780511534850 9781107424142 Year: 2007 Publisher: Cambridge Cambridge University Press

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Semiconductors --- Defects

Heteroepitaxy of semiconductors : theory, growth, and characterization
Author:
ISBN: 0849371953 9780849371950 Year: 2007 Publisher: Boca Raton : CRC Press,

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Light-emitting diodes : research, manufacturing, and applications XI.
ISBN: 9780819465993 Year: 2007 Publisher: Bellingham SPIE

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Book
Extended defects in semiconductors : electronic properties, device effects and structures
Authors: ---
ISBN: 1107159377 1280850515 9786610850518 0511278683 0511279280 0511277512 0511321716 0511276885 051153485X 0511278101 Year: 2007 Publisher: Cambridge : Cambridge University Press,

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Abstract

The elucidation of the effects of structurally extended defects on electronic properties of materials is especially important in view of the current advances in electronic device development that involve defect control and engineering at the nanometer level. This book surveys the properties, effects, roles and characterization of extended defects in semiconductors. The basic properties of extended defects (dislocations, stacking faults, grain boundaries, and precipitates) are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed. These topics are among the central issues in the investigation and applications of semiconductors and in the operation of semiconductor devices. The authors preface their treatment with an introduction to semiconductor materials and conclude with a chapter on point defect maldistributions. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.

Keywords

Semiconductors --- Defects. --- Failures.

Compound semiconductor bulk materials and characterizations
Author:
ISBN: 1281120731 9786611120733 9812770380 9810217285 9789810217280 9789812770387 Year: 2007 Publisher: New Jersey World Scientific

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This book is concerned with compound semiconductor bulk materials and has been written for students, researchers and engineers in material science and device fabrication. It offers them the elementary and intermediate knowledge of compound semiconductor bulk materials necessary for entering this field. In the first part, the book describes the physical properties, crystal growth technologies, principles of crystal growth, various defects in crystals, characterization techniques and applications. In the second and the third parts, the book reviews various compound semiconductor materials, inclu


Periodical
... IEEE International Symposium on Nanoscale Architectures.

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