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2007 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
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ISBN: 1424411793 1509090681 Year: 2007 Publisher: [Place of publication not identified] IEEE

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Linear and affine subspaces are commonly used to describe appearance of objects under different lighting, viewpoint, articulation, and identity. A natural problem arising from their use is - given a query image portion represented as a point in some high dimensional space - find a subspace near to the query. This paper presents an efficient solution to the approximate nearest subspace problem for both linear and affine subspaces. Our method is based on a simple reduction to the problem of nearest point search, and can thus employ tree based search or locality sensitive hashing to find a near subspace. Further speedup may be achieved by using random projections to lower the dimensionality of the problem. We provide theoretical proofs of correctness and error bounds of our construction and demonstrate its capabilities on synthetic and real data. Our experiments demonstrate that an approximate nearest subspace can be located significantly faster than the exact nearest subspace, while at the same time it can find better matches compared to a similar search on points, in the presence of variations due to viewpoint, lighting etc.

Pattern theory : from representation to inference
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ISBN: 9780198505709 0198505701 9780199297061 0199297061 Year: 2007 Publisher: New York (N.Y.) : Oxford university press,

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Proceedings of the Sixth International Conference on Advances in Pattern Recognition
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ISBN: 1281373184 9786611373184 9812772383 9789812772381 9789812705532 9812705538 9781281373182 6611373187 Year: 2007 Publisher: Singapore Hackensack, NJ World Scientific

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Contains a series of ICAPR proceedings on the advances of different facets of pattern recognition. This work tackles open problems in the classic fields of image and video processing, document analysis and multimedia object retrieval as well as more advanced topics in biometrics speech and signal analysis.


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Integralgeometrie für Stereologie und Bildrekonstruktion
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ISBN: 354037230X Year: 2007 Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer,

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Das vorliegende Buch gibt eine Einführung in die klassische Integralgeometrie und ihre praktischen Anwendungen in der Stereologie und der Bildrekonstruktion. Daher wird vor allem die elementare zweidimensionale Integralgeometrie und ihre praktisch bedeutsame Verallgemeinerung auf den dreidimensionalen Fall vorgestellt. Inhaltliche Schwerpunkte sind: Grundlagen der Konvexgeometrie, Integralgeometrie und Radon-Transformation. Zahlreiche anschauliche Beispiele und Anwendungen zeigen die grundlegende Bedeutung des Gebietes für Bildauswertungen in der Biologie, Medizin, Petrographie und Metallurgie. Jedes Kapitel enthält Aufgaben (mit Lösungen am Ende des Buches) die helfen, das Gelernte zu vertiefen. Umfangreiche biographische Notizen zu Integralgeometern und Stereologen runden das Buch ab. Ein grundlegendes, unverzichtbares und einzigartiges Werk für alle, die mit stereologischen Methoden in der Bildrekonstruktion arbeiten.

Pattern theory
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ISBN: 0191916560 1280753854 0191523119 1429470143 9780191523113 9781280753855 9781429470148 9786610753857 6610753857 0198505701 9780198505709 9780199297061 0199297061 9780191916564 Year: 2007 Publisher: Oxford Oxford University Press

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A comprehensive overview of the challenges in signal, data and pattern analysis in speech recognition, computational linguistics, image analysis and computer vision. Includes numerous exercises, an extensive bibliography, and additional resources -- extended proofs, selected solutions and examples -- on a companion website.

Legitimacy in international society
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ISBN: 9780199219193 0199219192 Year: 2007 Publisher: Oxford Oxford University Press

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Recognition, work, politics
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ISBN: 1281926256 9786611926250 9047419901 9789047419907 9789004157880 9004157883 9781281926258 6611926259 Year: 2007 Publisher: Leiden Boston Brill

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The essays in Recognition, Work, Politics indicate the diversity and continuity of contemporary French critical theory concerning both the question of politics and its philosophical articulation. These themes are approached and addressed from directions that include post-structuralism, the paradigm of the gift, and post-marxism. Recognition, Work, Politics also highlights critical theories developed in France today that concentrate on the central issues of recognition and work. These themes highlight the renewed reception of German Critical Theory in contemporary French thought particularly around the project of recognition developed by Axel Honneth. Philosophers and social and critical theorists published in Recognition, Work, Politics include Etienne Balibar, Jacques Rancière, Axel Honneth, Christophe Dejours, Alain Caillé, Christian Lazzeri, Emmanuel Renault, Gérard Raulet and Yves Sintomer.


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Numerical modeling of the airborne radar signature of dismount personnel in the UHF-, L-, Ku-, and Ka-bands
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Year: 2007 Publisher: Adelphi, MD : Army Research Laboratory,

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Numerical modeling of the airborne radar signature of dismount personnel in the UHF-, L-, Ku-, and Ka-bands
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Year: 2007 Publisher: Adelphi, MD : Army Research Laboratory,

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Vision Systems: : Segmentation and Pattern Recognition
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ISBN: 9535158104 390261305X Year: 2007 Publisher: IntechOpen

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Research in computer vision has exponentially increased in the last two decades due to the availability of cheap cameras and fast processors. This increase has also been accompanied by a blurring of the boundaries between the different applications of vision, making it truly interdisciplinary. In this book we have attempted to put together state-of-the-art research and developments in segmentation and pattern recognition. The first nine chapters on segmentation deal with advanced algorithms and models, and various applications of segmentation in robot path planning, human face tracking, etc. The later chapters are devoted to pattern recognition and covers diverse topics ranging from biological image analysis, remote sensing, text recognition, advanced filter design for data analysis, etc.

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