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Micro : contamination identification, analysis, and control
ISSN: 10810595 Year: 2006 Publisher: Santa Monica, CA: Canon Communications,

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Periodical
桂林电子科技大学学报/#/桂林電子科技大學學報 [[Kui Lin Tien Tzu K'O Chi Ta Hsueh Hsueh Pao]]
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Year: 2006 Publisher: Guilin Shi : Guilin dian zi ke ji da xue xue bao bian ji bu

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2006 IEEE Workshop on Microelectronics and Electron Devices : WMED : Boise, Idaho, Boise Center on the Grove, April 14, 2006
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ISBN: 142440374X 1509093486 Year: 2006 Publisher: Piscataway, New Jersey : IEEE,

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56th Electronic Components and Technology Conference 2006 : May 30, 2006-June 2, 2006.
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ISBN: 1424401526 1509091203 Year: 2006 Publisher: New York : IEEE,

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2006 IEEE International Symposium on Electronics and the Environment
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ISBN: 1424403510 1509092404 Year: 2006 Publisher: [Place of publication not identified] I E E E

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Book
2006 IEEE International Conference on Microelectronic Test Structures
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ISBN: 1424401674 1509092943 Year: 2006 Publisher: [Place of publication not identified] I E E E

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Book
Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International
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ISBN: 0780394992 0780394984 1509092471 Year: 2006 Publisher: Piscataway, N.J. : IEEE,

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Book
Electron Devices Meeting, 2006. IEDM '06. International
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ISBN: 1424404398 142440438X 1509091548 Year: 2006 Publisher: [Place of publication not identified] : IEEE,

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Principles of electronic materials and devices
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ISBN: 0072957913 Year: 2006 Publisher: Boston : Mc Graw Hill,

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Periodical
NEC technical journal
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Year: 2006 Publisher: Tokyo, Japan : External Relations Division, NEC Corporation,

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