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IEEE Trial-Use Standard for Voltage-Endurance Testing of Form-Wound Coils and Bars for Hydrogenerators : IEEE Std 1553-2002
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ISBN: 0738135119 0738135127 Year: 2003 Publisher: New York : Institute of Electrical and Electronics Engineers,

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The test parameters and acceptance criteria for voltage-endurance testing of form-wound bars and coils for use in large hydrogenerators are covered in this standard.

Cool Appliances : Policy Strategies for Energy-Efficient Homes
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ISBN: 1280035749 9786610035748 9264100520 9264196617 Year: 2003 Publisher: Paris : OECD Publishing,

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In IEA member countries, electrical appliances are the fastest growing energy users, after automobiles. Cost-effective technology exists that could improve the energy efficiency of appliances by more than one-third in ten years. The greenhouse gases emitted as a result of the use of appliances alone could be slashed by the equivalent of 322 million tonnes of CO2 per year by 2010. This book assesses the potential energy savings and carbon reductions to be achieved through technical improvements to appliances.

Operating, testing, and preventive maintenance of electrical power apparatus
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ISBN: 0130417742 Year: 2003 Publisher: Upper Saddle River, N.J. : Prentice Hall,

Power systems electromagnetic transients simulation
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ISBN: 0852961065 Year: 2003 Publisher: London : Institution of Electrical Engineers,

High-frequency oscillator design for integrated transceivers
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ISBN: 1280459492 9786610459490 0306487160 1402075642 Year: 2003 Publisher: Boston : Kluwer Academic,

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High-Frequency Oscillator Design for Integrated Transceivers covers the analysis and design of all high-frequency oscillators required to realize integrated transceivers for wireless and wired applications. This includes the design of oscillator types as single-phase LC oscillators, I/Q LC oscillators, multi-phase LC oscillators, and ring oscillators in various IC technologies such as bipolar, BiCMOS, CMOS, and SOI (silicon on insulator). Starting from an in depth review of basic oscillator theory, the authors discuss key oscillator specifications, numerous oscillator circuit topologies, and introduce the concepts of design figures of merit (FOMs) and benchmark FOMs, which assist the oscillator designer during the overall design cycle. Taking advantage of behavioral modeling, the elementary properties of LC oscillators and ring oscillators are analyzed first. A detailed analysis of oscillator properties at circuit level follows taking parasitic elements and other practical aspects of integrated oscillator design into account. Special attention is given to advantages and limitations of linear time invariant (LTI) phase noise modeling, leading to the concept of optimum coupling in I/Q LC oscillators and a simulation method for fast and efficient phase noise optimization in oscillators. In addition, all modern linear time variant (LTV) phase noise theories are covered. As not only phase noise is of high importance to the designer, but optimization of other oscillator properties as well, additional subjects such as various tuning methods of LC oscillators are analyzed, too. Design examples of integrated LC and ring oscillators in the frequency range of 100 MHz up to 11 GHz are thoroughly discussed throughout the book. The clear and structured discussion of basic oscillator properties make High-Frequency Oscillator Design for Integrated Transceivers an excellent starting point for the inexperienced oscillator designer. The detailed analysis of many oscillator types and circuit topologies, the discussion of numerous practical design issues together with fast optimization methods, and more than 200 carefully selected literature references on oscillator literature, LC oscillator and ring oscillator designs make this book a very valuable resource for the experienced IC designer as well.

The design of low noise oscillators
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ISBN: 0792384555 0306481995 9780792384557 Year: 2003 Publisher: New York : Kluwer Academic Publishers,

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It is hardly a revelation to note that wireless and mobile communications have grown tremendously during the last few years. This growth has placed stringent requi- ments on channel spacing and, by implication, on the phase noise of oscillators. C- pounding the challenge has been a recent drive toward implementations of transceivers in CMOS, whose inferior 1/f noise performance has usually been thought to disqualify it from use in all but the lowest-performance oscillators. Low noise oscillators are also highly desired in the digital world, of course. The c- tinued drive toward higher clock frequencies translates into a demand for ev- decreasing jitter. Clearly, there is a need for a deep understanding of the fundamental mechanisms g- erning the process by which device, substrate, and supply noise turn into jitter and phase noise. Existing models generally offer only qualitative insights, however, and it has not always been clear why they are not quantitatively correct.

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