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Particle induced x-ray emission and its analytical applications : proceedings of the ninth international conference on pixe and its analytical applications, Guelph, Ontario, Canada, 8-12 June 2001
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Authors:
Campbell, John L.
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International conference on pixe and its analytical applications ( 9th : 2001 : Guelph, Ontario, Canada)
Year: 2002 Publisher: Amsterdam: Elsevier,
Year: 2002 Publisher: Amsterdam: Elsevier,
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