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This study provides a thorough description of the techniques involved in obtaining information about materials, including X-ray diffractometers and their associated instrument functions, data collection methods and the simulation of the patterns.

Semiconductors. --- X-rays --- X-ray scattering --- Scattering (Physics) --- Crystalline semiconductors --- Semi-conductors --- Semiconducting materials --- Semiconductor devices --- Crystals --- Electrical engineering --- Electronics --- Solid state electronics --- Scattering. --- Materials --- Electronics and optics of solids