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Handbook of semiconductor technology
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ISBN: 3527298347 3527298355 352729970X Year: 2000 Publisher: Weinheim : Wiley-VCH,

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2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings
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Year: 2000 Publisher: [Place of publication not identified] IEEE Computer Society

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Dissertation
Contribution au classement des fruits par analyse d'images numériques : Application au tri en ligne des pommes Golden delicious et Jonagold.
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Year: 2000

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This work aims to set up an automatic external quality fruit grading method. Special attention is drawn to various defects as wound, blemishes, physiological diseases, fungi attack, etc. Two 3- CCD cameras mounted on a proof bank were used for the image acquisition. For Golden delicious apple, characterized by an uniform colour, this latter was modelled by a multivariate gaussian distribution and the defect detection was carried out by computing the Mahalanobis distance separating a pixel's colour and the mean colour of the fruit. For Jonagold apples, having a multimodal colour frequency distribution, the defect location was based on a non-parametric model of the fruit colour and on Baye's theorem. In both cases, the development of an algorithm taking into account local information enhanced the segmentation precision. The calyx and stem ends, looking as a defect on the image, were detected by a pattern correlation technique. The segmented areas (poles, defects and over segmentation) were characterized with shape, colour and texture descriptors. The fruit grading into four classes (Extra, A, B and cull) according to European standards is obtained from using a cluster analysis on the segmented regions. The results obtained are favourable and make it possible to envisage the transfer of developed algorithms onto a commercial sorting machine.


Book
non-vital bus fault leads to fire and loss of offsite power
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Year: 2000 Publisher: Washington, D.C. : U.S. Nuclear Regulatory Commission, Office of Nuclear Reactor Regulation,

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Substandard material supplied by Chicago Bullet Proof Systems
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Year: 2000 Publisher: Washington, D.C. : U.S. Nuclear Regulatory Commission, Office of Nuclear Reactor Regulation,

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Retinologie heute : in memoriam Klaus Heimann (22.6.1935-25.6.1999)
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ISBN: 3928027220 9783928027229 Year: 2000 Publisher: Germering Ad Manum Medici

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Book
2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings
Authors: --- --- --- ---
Year: 2000 Publisher: [Place of publication not identified] IEEE Computer Society

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