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Methods for testing and measuring the characteristics of surge protectors used in low-voiltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms or 1200 V dc are established. The Surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements. Tests are included for characterizing standby performance, surge-limiting capabilities, and surge lifetime. Packaged single gas-tube, air-gap, varistor, or avalanche junction surge-protective devices are not covered, nor are test mathods for low-voltage power circuit applications, surge-protective devices are not covered, nor are test methods for low-voltage power circuit applications.
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Over the last 40 years, Principles of Transistor Circuits has provided students and practitioners with a text they can rely on to keep them at the forefront of transistor circuit design. Although integrated circuits have widespread application, the role of discrete transistors both as important building blocks which students must understand, and as practical solutions to design problems, remains undiminished.The ninth edition has been thoroughly updated to cover the latest technology and applications, including computer circuit simulation, and many diagrams have been revised to
Transistor circuits. --- Electronic circuits. --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics --- Electronic circuits --- Transistors
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Electronic circuits --- Circuits électroniques --- Testing --- Tests. --- Circuits électroniques
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Computer vision --- Integrated circuits --- Linear integrated circuits
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