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2000 (2)

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2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings
Authors: Menon, Sankaran M --- Sachdev, Manoj --- Malaiya, Yashwant K --- IEEE International Workshop on Defect Based Testing --- IEEE Computer Society Test Technology Technical Committee
Year: 2000 Publisher: [Place of publication not identified] IEEE Computer Society

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Keywords
Integrated circuits --- Iddq testing --- Metal oxide semiconductors, Complementary --- Defects

Book

2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings
Authors: Menon, Sankaran M --- Sachdev, Manoj --- Malaiya, Yashwant K --- IEEE International Workshop on Defect Based Testing --- IEEE Computer Society Test Technology Technical Committee
Year: 2000 Publisher: [Place of publication not identified] IEEE Computer Society

Abstract | Keywords | Export | Availability | Bookmark

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Abstract

Keywords
Integrated circuits --- Iddq testing --- Metal oxide semiconductors, Complementary --- Electrical & Computer Engineering --- Electrical Engineering --- Engineering & Applied Sciences --- Defects

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