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book (21)


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English (21)


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1995 (21)

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Book
Helical (spiral) computed tomography.
Year: 1995 Publisher: London : W.B. Saunders,

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Book
Physical and non-physical methods of solving crystal structures
Authors: ---
ISBN: 0511599862 Year: 1995 Publisher: Cambridge : Cambridge University Press,

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Theoretical and experimental advances in the techniques available for solving crystal structures have led to the development of several powerful techniques for solving complex structures, including those of proteins. In this 1995 book, Michael Woolfson and Fan Hai-Fu describe all the available methods and how they are used. In addition to traditional methods such as the use of the Patterson function and isomorphous replacement, and the direct methods, the authors include methods that use anomalous scattering and observations from multiple-beam scattering. The fundamental physics and mathematical analyses are fully explained. Practical aspects of applying the methods are emphasised.

The lives of the neutron stars
Authors: ---
ISBN: 0792332466 9780792332466 Year: 1995 Publisher: Dordrecht: Kluwer,

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Handbook of X-ray Photoelectron Spectroscopy : a reference book of standard spectra for identification and interpretation of XPS data
Authors: --- ---
ISBN: 096481241X Year: 1995 Publisher: Eden Prairie Perkin-Elmer

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Exploring the X-ray universe
Authors: ---
ISBN: 0521437121 0521261821 Year: 1995 Publisher: Cambridge : Cambridge University Press,

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Exploring the X-ray Universe describes the view of the stars and galaxies that is obtained through X-ray telescopes. This account of X-ray astronomy incorporates the latest findings from several observatories operating in space. These include the Einstein Observatory operated by NASA, the EXOSAT satellite of the European Space Agency, and the German satellite, ROSAT. The book covers the entire field, with chapters on stars, supernova remnants, normal and active galaxies, clusters of galaxies, the diffuse X-ray background, and more. The authors review basic principles, include the necessary historical background, and explain exactly what we know from X-ray observations of the universe. Copiously illustrated, the book is a complete account of X-ray astronomy. There are 200 illustrations, many in full color, from X-ray, optical and infrared telescopes. Many of the X-ray images are previously unpublished and appear for the first time in this book. Clear diagrams support the text, and more specialized topics are covered in separate boxed features. The book is accessible to anyone with a basic knowledge of science and some understanding of general astronomy. It is suitable for amateur astronomers, students interested in the high-energy universe, and professionals needing a source book of X-ray images.

Advances in x-ray analysis : Proceedings of the Forty-third Annual Conference on Applications of X-Ray Analysis
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ISBN: 0306450453 9780306450457 Year: 1995 Publisher: New York Plenum

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X-ray binaries
Authors: --- ---
ISBN: 0521416841 Year: 1995 Volume: 26 Publisher: Cambridge : Cambridge University Press,

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Particle-induced X-ray emission spectrometry (PIXE)
Authors: --- ---
ISBN: 0471589446 9780471589440 Year: 1995 Volume: 133 Publisher: New York : Wiley,

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Long proven as an analytical tool of uncommon accuracy and utility, particle-induced X-ray emission has enjoyed a solid, if narrow, reputation in the area of chemical analysis. Capable of detecting elemental concentrations down to parts per million, PIXE is now a standard component of the analytical arsenal of the nuclear physics laboratory. Yet in wider avenues of chemical research, PIXE technology is still relatively new and untested.An inside look at the nuts and bolts of PIXE from specialists who've refined the technique in biomedicine, atmospheric science, geology, and art and archaeology, this comprehensive introduction to PIXE reveals its conceptual foundation and unique methodology as well as its, as yet, enormous untapped potential as a primary analytical tool. Particle-Induced X-Ray Emission Spectrometry (PIXE) offers professionals and students a practical, user-based look at the many facets and current uses of PIXE for multielemental analysis while providing a stimulus for creative, insightful investigation.Beginning with a brief history of PIXE, the book then introduces the reader to the conceptual basics central to understanding and using PIXE. It details the hardware and methodology that make up PIXE, examining its instrumentation, characteristics of x-ray spectroscopy, standardization of quantitative analysis, the accuracy of PIXE analysis, and its limits of detection. The technique of focusing proton beams to micron dimensions with the nuclear microprobe is thoroughly detailed, with practical advice on what pitfalls to avoid, and clear illustrations of its present uses in biomedicine, materials science, archaeology, and earth science.The following chapters form a comprehensive catalog of the cutting-edge uses of PIXE in a host of fields, shedding light on the technical specifics unique to each area of research as well as the intrinsic versatility of PIXE. A discussion of biological and medical applications includes a look at sample preparation

The Rietveld method
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ISBN: 0198555776 0198559127 9780198559122 Year: 1995 Volume: 5 Publisher: Birmingham : Oxford [etc.] : International Union of Crystallography, Oxford University Press,

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The Rietveld method is a powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data. Since such structural details dictate much of the physical and chemical attributes of materials, knowledge of them is crucial to our understanding of those properties and our ability to manipulate them. Since most materials of technological interest are not available as single crystals but often are available only in polycrystalline or powder form, the Rietveld method has become very important and is now widely used in all branches of science that deal with materials at the atomic level. This book, a collaboration by many authorities in the field, is intended primarily to have tutorial and advisory value for those who already have some experience with this important method, but an introductory chapter enables the book to be used as a first text for researchers starting in this area of science. The audience is thus comprised of all scientists using the method: graduate students who may be starting research in this area, powder diffraction specialists, crystallographers, physicists, chemists, and materials scientists.

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