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Thin film cracking in plastic IC / wire bond failure modes / electromigration phenomena / hot-carrier degradation / reliability aspects of HEMTs.
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Thin film cracking in plastic IC / wire bond failure modes / electromigration phenomena / hot-carrier degradation / reliability aspects of HEMTs.
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Semiconductor lasers --- Light emitting diodes --- Reliability. --- Reliability.
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The proceedings of the Symposium held in Austin, Texas, May 1991 comprise panel discussions and papers in the areas of metrics, software reliability models, software reliability tools, formal methods, applications, and metrics and measurement. No index. Annotation copyrighted by Book News, Inc., Portland, OR.
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The proceedings of the Symposium held in Austin, Texas, May 1991 comprise panel discussions and papers in the areas of metrics, software reliability models, software reliability tools, formal methods, applications, and metrics and measurement. No index. Annotation copyrighted by Book News, Inc., Portland, OR.
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