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Year: 1991 Publisher: [Place of publication not identified] IEEE
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Thin film cracking in plastic IC / wire bond failure modes / electromigration phenomena / hot-carrier degradation / reliability aspects of HEMTs.
Book
Year: 1991 Publisher: New York (N.Y.): Dekker
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ISBN: 033354238X Year: 1991 Publisher: Basingstoke Macmillan
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Year: 1991 Publisher: [Place of publication not identified] IEEE
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Thin film cracking in plastic IC / wire bond failure modes / electromigration phenomena / hot-carrier degradation / reliability aspects of HEMTs.
ISBN: 0890064652 Year: 1991 Publisher: Boston : Artech House,
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Semiconductor lasers --- Light emitting diodes --- Reliability. --- Reliability.
ISBN: 0852987811 Year: 1991 Publisher: London Mechanical engineering publ.
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Year: 1991 Publisher: [Place of publication not identified] IEEE Computer Society Press
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The proceedings of the Symposium held in Austin, Texas, May 1991 comprise panel discussions and papers in the areas of metrics, software reliability models, software reliability tools, formal methods, applications, and metrics and measurement. No index. Annotation copyrighted by Book News, Inc., Portland, OR.
Book
ISBN: 0879422645 Year: 1991
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ISBN: 1851665137 Year: 1991 Publisher: London New York New York, NY, USA Elsevier Applied Science Sole distributor in the USA, Elsevier Science Pub. Co.
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Year: 1991 Publisher: [Place of publication not identified] IEEE Computer Society Press
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The proceedings of the Symposium held in Austin, Texas, May 1991 comprise panel discussions and papers in the areas of metrics, software reliability models, software reliability tools, formal methods, applications, and metrics and measurement. No index. Annotation copyrighted by Book News, Inc., Portland, OR.
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