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ISBN: 1559370173 Year: 1989 Publisher: [Place of publication not identified] : IEEE,
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This guide has been written as an applications manual for engineers and authors who will be writing test procedures in ATLAS (Abbreviated Test Language for All Systems). It is not intended to be a substitute for an instruction manual in the ATLAS language, but, rather, a practical extension to such a manual. The purpose is to provide principles of good practice in the use of ATLAS for the writing of test procedures.
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621.3.049.77 --- Automatic checkout equipment --- -Integrated circuits --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Electronic circuits --- Microelectronics --- ACE (Automatic checkout equipment) --- ATE (Automatic test equipment) --- Built-in test equipment --- Electronic instruments --- Nondestructive testing --- Microelectronics. Integrated circuits --- Congresses --- Testing --- -Congresses. --- Equipment and supplies --- 621.3.049.77 Microelectronics. Integrated circuits --- Automatic test equipment --- Integrated circuits
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