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Secondary ion mass spectrometry SIMS VI : proceedings of the sixth international conference on secondary ion mass spectrometry (SIMS VI), Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987
Authors: Benninghoven, Alfred --- Huber, A. M. --- Werner, H. W. --- International conference on secondary ion mass spectrometry.
ISBN: 0471918326 Year: 1988 Publisher: Chichester : John Wiley,

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Abstract

Keywords
Secondary ion mass spectrometry --- Spectrométrie de masse des ions secondaires --- Secondary ion mass spectroscopy --- Spectrométrie de masse des ions secondaires --- Spectrométrie de masse des ions secondaires.

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