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Evaluation of signal plus noise detection error in an envelope detector with logarithmic compression
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Authors:
Estin, A. J.
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Daywitt, W. C.
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United States.
Year: 1979 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
Year: 1979 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
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