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This standard provides standard test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation. It supersedes the previous edition, IEEE Std 301-1969 (ANSI N42.2-1969). The standard has been modified and refined based on the experience gained in using the earlier edition over a six-year period and taking into account advances in the technology. Improvements in preamplifier noise characteristics and pulse shaping techniques as well as increased utilization of integral detector-preamplifier assemblies have occurred in recent years.
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