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book (7)

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English (7)

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1964 (7)

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Book

Single-crystal films : proceedings of an international conference held at Philco scientific laboratory, Blue Bell, Pennsylvania, May 1963
Authors: Francombe, Maurice H. --- Philco scientific laboratory --- Conference on Single-Crystal Films (1963 ; Blue Bell, Pa, US)
Year: 1964 Publisher: Oxford: Pergamon,

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Thin films

Book

Single-crystal films; : proceedings of an International Conference held at Philco Scientific Laboratory, Blue Bell, Pennsylvania, May 1963
Authors: Francombe, Maurice H. --- Satā, Hiroshi --- Conference on Single-Crystal Films --- Philco Scientific Laboratory
Year: 1964 Publisher: Oxford : Pergamon Press,

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Thin films.

Book

Ellipsometry in the measurement of surfaces and thin films : symposium proceedings.
Authors: Kruger, Jerome --- Passaglia, Elio --- Stromberg, R. R. --- Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films
Year: 1964 Publisher: Washington : U.S. National Bureau of Standards,

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Polarization (Light) --- Surfaces (Technology) --- Thin films.

Book

Ellipsometry in the measurement of surfaces and thin films : symposium proceedings.
Authors: Kruger, Jerome --- Passaglia, Elio --- Stromberg, R. R. --- Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films
Year: 1964 Publisher: Washington : U.S. National Bureau of Standards,

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Polarization (Light) --- Surfaces (Technology) --- Thin films.

Book

A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films
Authors: McCrackin, F. L. --- United States.
Year: 1964 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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FORTRAN (Computer program language) --- Thin films --- Optical properties.

Book

A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films
Authors: McCrackin, F. L. --- United States.
Year: 1964 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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FORTRAN (Computer program language) --- Thin films --- Optical properties.

Book

Ellipsometry in the measurement of surfaces and thin films : Symposium proceedings, Washington 1963 : Symposium held September 5-6, 1963 at the National Bureau of standards
Authors: Passaglia, Elio --- Stromberg, R. R. --- Kruger, Jerome --- Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films
Year: 1964 Publisher: Washington : U.S. National Bureau of Standards,

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Keywords
Polarization (Light) --- Surfaces (Technology) --- Thin films. --- Polarisation (Lumière) --- Surfaces (Technologie)

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