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XV International Conference on Electron Microscopy
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ISBN: 3038269301 9783038269304 Year: 2015 Publisher: Zurich Trans Tech Publishers

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The papers published in this volume of Solid State Phenomena are written on the basis of selected presentations from the XV International Conference on Electron Microscopy EM2014, which took place in Kraków from the 15th to the 18th of September 2014. The papers present the recent results of the applications of electron microscopy methods for microstructural studies in materials science. The main focus of the conference was on applying electron microscopy methods in material science, physics, chemistry, and the earth and life sciences. The 21 papers consider such topics as the mechanical and s


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Discovery of Co-existing Non-collinear Spin Textures in D2d Heusler Compounds
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ISBN: 9783031039102 Year: 2022 Publisher: Cham Springer International Publishing :Imprint: Springer

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Electron microscopy and analysis
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ISBN: 0748409688 9781420017250 142001725X 9781138441538 1138441538 9780748409686 0429176252 1482289342 1282777971 9786612777974 0203184254 9781482289343 Year: 2017 Publisher: Boca Raton

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"Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook."--Provided by publisher.


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Advanced electron microscopy and nanomaterials
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ISBN: 3038133361 9783038133360 9780878492817 087849281X Year: 2010 Publisher: Stafa-Zurich, Switzerland Enfield, NH Trans Tech Publications

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The aim of this special volume was to bring together scholars, from diverse regions of the world, whose scientific achievements bear witness to their outstanding contributions to current developments in, and applications of, electron microscopy as applied to materials science and nanomaterials research. The topics covered include: Multifunctional Nanocomposites, Smart materials, Nanoparticles: synthesis and applications, Structure phenomena and modeling, Growth of thin films, Semiconductors and optoelectronic materials, Other Nanomaterials and Interdisciplinary Topics. This edition thus provid

Scanning electron microscopy in archaeology
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ISBN: 0860545792 Year: 1988 Volume: vol 452 Publisher: Oxford : BAR,

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Scanning electron microscopy for the life sciences
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ISBN: 9780521195997 9781139018173 9781139839600 1139839608 1139018175 9781139841986 113984198X 9781139844345 1139844342 9781139844345 9781139840798 1139840797 0521195993 1283812517 9781283812511 1107232872 1139853430 1139845497 9781107232877 9781139853439 9781139845496 Year: 2012 Publisher: Cambridge : Cambridge University Press,

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Recent developments in scanning electron microscopy (SEM) have resulted in a wealth of new applications for cell and molecular biology, as well as related biological disciplines. It is now possible to analyze macromolecular complexes within their three-dimensional cellular microenvironment in near native states at high resolution and to identify specific molecules and their structural and molecular interactions. New approaches include cryo-SEM applications and environmental SEM (ESEM), staining techniques and processing applications combining embedding and resin-extraction for imaging with high resolution SEM, and advances in immuno-labeling. New developments include helium ion microscopy, automated block-face imaging combined with serial sectioning inside an SEM chamber, and Focused Ion Beam Milling (FIB) combined with block-face SEM. With chapters written by experts, this guide gives an overview of SEM and sample processing for SEM and highlights several advances in cell and molecular biology that greatly benefited from using conventional, cryo, immuno and high-resolution SEM.

Introduction to conventional transmission electron microscopy
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ISBN: 1107127742 051107753X 0511202857 0511556020 0511615094 0511075960 9780511077531 0521620066 9780521620062 0521629950 9780521629959 9780511615092 9780511075964 0511074425 9780511074424 9780511556029 Year: 2003 Publisher: Cambridge, U.K. New York, N.Y. Cambridge University Press

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This 2003 book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.

High-resolution transmission electron microscopy
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ISBN: 1280523247 9786610523245 0195364651 9780195364651 9781280523243 0195042751 9780195042757 661052324X Year: 1988 Publisher: New York Oxford University Press

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Provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. This book includes discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, and more.


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Compact Introduction to Electron Microscopy
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ISBN: 9783658373641 Year: 2023 Publisher: Wiesbaden Springer Fachmedien Wiesbaden :Imprint: Springer

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Non-destructive microanalysis of cultural heritage materials
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ISBN: 0444507388 9786610633722 1280633727 0080454429 Year: 2004 Publisher: Amsterdam : Elsevier,

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