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Experimental solid state physics --- Optics. Quantum optics --- Materials. --- Electron microscopy. --- Matériaux --- Microscopie électronique --- Matériaux --- Microscopie électronique --- Materials --- Electron microscopy --- #KVIV --- Engineering --- Engineering materials --- Industrial materials --- Engineering design --- Manufacturing processes --- Microscopy

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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. ``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.'' John Hutchison in Journal of Microscopy ``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.'' Ray Egerton in Micron ``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.'' John C. H. Spence, Arizona State University ``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.'' Colin Humphreys, Cambridge University ``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.'' Ronald Gronsky, University of California, Berkeley

Solid state physics --- Physics --- Chemical and physical crystallography --- Materials sciences --- elektronenmicroscopie --- kristallografie --- materiaalkennis --- toegepaste wetenschappen --- spectroscopie --- fysica --- fysicochemie --- Materials --- Transmission electron microscopy --- X-ray diffractometer. --- Matériaux --- Microscopie électronique à transmission --- Diffractomètres à rayons X --- Microscopy --- Microscopie --- EPUB-LIV-FT SPRINGER-B LIVCHIMI

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During the last decade we have been witness to several exciting achievements in electron crystallography. This includes structural and charge density studies on organic molecules complicated inorganic and metallic materials in the amorphous, nano-, meso- and quasi-crystalline state and also development of new software, tailor-made for the special needs of electron crystallography. Moreover, these developments have been accompanied by a now available new generation of computer controlled electron microscopes equipped with high-coherent field-emission sources, cryo-specimen holders, ultra-fast CCD cameras, imaging plates, energy filters and even correctors for electron optical distortions. Thus, a fast and semi-automatic data acquisition from small sample areas, similar to what we today know from imaging plates diffraction systems in X-ray crystallography, can be envisioned for the very near future. This progress clearly shows that the contribution of electron crystallography is quite unique, as it enables to reveal the intimate structure of samples with high accuracy but on much smaller samples than have ever been investigated by X-ray diffraction. As a tribute to these tremendous recent achievements, this NATO Advanced Study Institute was devoted to the novel approaches of electron crystallography for structure determination of nanosized materials.

Crystallography --- Electron microscopy --- Cristallographie --- Microscopie électronique --- Congresses. --- Congrès --- EPUB-LIV-FT LIVPHYSI Nanosized SPRINGER-B materials --- Congresses --- Crystallography. --- Surfaces (Physics). --- Mineralogy. --- Catalysis. --- Crystallography and Scattering Methods. --- Characterization and Evaluation of Materials. --- Surfaces and Interfaces, Thin Films. --- Activation (Chemistry) --- Chemistry, Physical and theoretical --- Surface chemistry --- Physical geology --- Minerals --- Physics --- Surfaces (Technology) --- Leptology --- Physical sciences --- Mineralogy --- Materials science. --- Materials—Surfaces. --- Thin films. --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Coatings --- Thick films --- Material science --- Materials --- Surfaces. --- Surface phenomena --- Friction --- Surfaces (Physics) --- Tribology --- Surfaces